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A Newly Designed Contact Profiler for Microstructure  

Choi, Dong-Jun (LG Electronics)
Choi, Jai-Seong (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology)
Choi, In-Mook (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology)
Kim, Soo-Hyun (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology)
Publication Information
Abstract
A simple and low cost stylus profiler made of ferrite cores is developed. The devised profiler consists of a contact probe, a measuring transducer, a signal processing unit, and a motorized stage. The contact probe attached to 4-bar spring maintains sufficient stiffness to protect disturbances. An overlap-area type inductive position sensing system is selected as a measuring transducer, which has high sensitivity, repeatability and linearity. The transducer is composed of coil bundles and ferrite cores which have good electromagnetic characteristics in spite of low cost. The repeatability of the profiler with the proposed inductive sensing system is better than 50nm. Experimental results are shown that the proposed profiler can measure the line or 3D profile of an object with sub-micron features.
Keywords
stylus profiler; inductive sensor; ferrite; 4-bar spring; gauge block; 3D measurement;
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Times Cited By KSCI : 1  (Citation Analysis)
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1 Jeff Donnelly, Winston Sze, 'Stylus profilers in AMLCD manufacturing,' Solid State Technology, JUNE, pp. 157-160, 1996
2 Jeffrey B et al, 'Stylus NanoProfilometry: A new approach to CD metrology,' Solid State Technology, June, pp. 45-53, 1999
3 V.B. Badami, S.T. Smith, et al, 'A portable three-dimensional stylus profile measuring instrument,' Precision Engineering, Vol. 18, pp. 147-156, 1996   DOI   ScienceOn
4 熊田毅史, 三井公之, 中暢和雄, 生田日英幸, '粗微動連動制微による表面租さ測定に關する硏究,' 精密工學會誌, Vol. 63, No. 10, pp. 1439-1443, 1997
5 K. C. Fan, C. Y. Lin and L. H. Shyu, 'The development of a low-cost focusing probe for profile measurement,' Meas. Sci. Technol. 11, N1-N7, 2000   DOI   ScienceOn
6 최동준, 최인묵, 김수현, '인덕턴스형 미소 변위 측정 시스템과 응답 특성의 분석,' 한국정밀공학회지, 제 18 권, 제 3 호, pp. 189-194, 2001   과학기술학회마을
7 E. C. Teague, F. E. Scire, S. M. Baker and S. W. Jensen, 'Three-dimensional stylus profilometry,'Wear, Vol. 83, pp. 1-12, 1982   DOI   ScienceOn
8 Euan Morrison, 'The development of a prototype high-speed stylus profilometer and its application to rapid 3D surface measurement,' Nanotechnology 7, pp. 37-42, 1996   DOI   ScienceOn
9 Dong-June Choi and Soo Hyun Kim, 'Flexible Inductive Transducer with Magnetic Resistance Influenced by Variable Overlap Area,' Jpn. J. Appl. Phys. Vol. 40, pp. 5153-5158, 2001   DOI
10 Barry E Jones, 'Sensors in industrial metrology,' J. Phys. E: Sci. Instrum., Vol. 20, pp. 1113-1126, 1987   DOI   ScienceOn
11 Web site, http://www.tencor.com
12 Euan Morrison, 'A Prototype Scanning Stylus Profilometer for Rapid Measurement of Small Surface Areas,' Int. J. Mach. Tools Manufact., Vol. 35, No. 2, pp. 352-331, 1995   DOI   ScienceOn
13 R. Nicolaides, et al, 'Scanning tunneling microscope tip structures,' J. Vac. Sci. Technol., A. Vol. 6, No. 2, pp. 445-447, 1988   DOI
14 Web site: http://www.renishaw.com
15 Web site, http://www.taylor-hobson.com
16 D. K. Biegelsen, F. A. Ponce and J. C. Tranomtana and S. M. Koch, 'Ion milled tips for scanning tunneling microscopy,' Appl. Phys. Lett. Vol. 50, No. 11, pp. 696-698, 187   DOI
17 Web site, http://www.veeco.com