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http://dx.doi.org/10.5515/KJKIEES.2018.29.5.344

Calibration of Frequency Response for a Sampling Oscilloscope  

Cho, Chihyun (Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science)
Lee, Dong-Joon (Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science)
Lee, Joo-Gwang (Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.29, no.5, 2018 , pp. 344-352 More about this Journal
Abstract
We herein propose a calibration method for a sampling oscilloscope. The proposed method can correct the systematic errors in the oscilloscope such as time-based distortion and impedance mismatch. In addition, it can accurately estimate the residual jitter that remains after a time-based correction and the scale factor that varies in accordance with the setting of the pulse generator. The proposed method is validated thorough the comparison and verification with the power meter, and the uncertainty of the measurement method is analyzed.
Keywords
Frequency Response; Oscilloscope; Traceability; Calibration;
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1 J. A. Jargon, C. Cho, D. F. Williams, and P. D. Hale, "Physical models for 2.4 mm and 3.5 mm coaxial VNA calibration kits developed within the NIST microwave uncertainty framework," in 2015 85th Microwave Measurement Conference(ARFTG), Phoenix, May 2015, pp. 1-7.
2 JCGM, "Evaluation of Measurement Data - Guide to the Expression of Uncertainty in Measurement JCGM 100: 2008 (GUM 1995 with minor corrections)," 2008.
3 C. Cho, J. G. Lee, J. H. Kim, and D. C. Kim, "Uncertainty analysis in EVM measurement using a Monte Carlo simulation," Transactions on Instrumentation and Measurement, vol. 64, no. 6, pp. 1413-1418, Jun. 2015.   DOI
4 C. Cho, J. G. Lee, P. D. Hale, J. A. Jargon, P. Jeavons, and J. B. Schlager, et al., "Calibration of channel mismatch in time-interleaved real-time digital oscilloscopes," in 2015 85th Microwave Measurement Conference (ARFTG), Phoenix, May 2015, pp. 1-5.
5 C. Cho, J. G. Lee, P. D. Hale, J. A. Jargon, P. Jeavons, and J. B. Schlager, et al., "Calibration of time-interleaved errors in digital real-time oscilloscopes," IEEE Transactions on Microwave Theory and Techniques, vol. 64, no. 11, pp. 4071-4079, Nov. 2016.   DOI
6 D. Kim, J. G. Lee, D. J. Lee, and C. Cho, "Traceable calibration for a digital real-time oscilloscope with time interleaving architecture," Measurement Science and Technology, vol. 29, no. 1, p. 015003, Dec. 2017.
7 K. Rush, S. Draving, and J. Kerley, "Characterizing highspeed oscilloscopes," IEEE Spectrum, vol. 27, no. 9, pp. 38-39, Sep. 1990.   DOI
8 J. Verspecht, K. Rush, "Individual characterization of broad-band sampling oscilloscopes with a nose-to-nose calibration procedure," IEEE Transactions on Instrumentation and Measurement, vol. 43, no. 2, pp. 347-354, Apr. 1994.   DOI
9 P. D. Hale, T. S. Clement, K. J. Coakley, C. M. Wang, D. C. DeGroot, and A. P. Verdoni, "Estimating the magnitude and phase response of a 50 GHz sampling oscilloscope using the 'nose-to-nose' method," in 55th ARFTG Conference Digest, Boston, MA, Jun. 2000, pp. 1-8.
10 D. F. Williams, T. S. Clement, K. A. Remley, P. D. Hale, and F. Verbeyst, "Systematic error of the nose-tonose sampling oscilloscope calibration," IEEE Transactions on Microwave Theory and Techniques, vol. 55, no. 9, pp. 1951-1957, Sep. 2007.   DOI
11 T. S. Clement, P. D. Hale, D. F. Williams, C. M. Wang, A. Dienstfrey, and D. A. Keenan, "Calibration of sampling oscilloscopes with high-speed photodiodes," IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 8, pp. 3173-3181, Aug. 2006.   DOI
12 J. A. Jargon, P. D. Hale, and C. M. Wang, "Correcting sampling oscilloscope timebase errors with a passively mode-locked laser phase locked to a microwave oscillator," IEEE Transactions on Instrumentation and Measurement, vol. 59, no. 4, pp. 916-922, Apr. 2010.   DOI
13 H. Füser, S. Eichstadt, K. Baaske, C. Elster, K. Kuhlmann, and R. Judaschke, et al., "Optoelectronic timedomain characterization of a 100 GHz sampling oscilloscope," Measurement Science and Technology, vol. 23, no. 2, p. 025201, 2012.   DOI
14 이동준, 이주광, 권재용, 강태원, "1 GHz 대역 임펄스의 스펙트럼 진폭 불확도 평가," 한국전자파학회논 문지, 23(12), pp. 1365-1372, 2012년 12월.
15 D. F. Williams, T. S. Clement, P. D. Hale, and A. Dienstfrey, "Terminology for high-speed sampling oscilloscope calibration," in 2006 68th Microwave Measurement Conference(ARFTG), Dec. 2006, pp. 9-14.
16 D. F. Williams, A. Lewandowski, T. S. Clement, J. C. Wang, P. D. Hale, and J. M., Morgan, et al., "Covariancebased uncertainty analysis of the NIST electrooptic sampling system," IEEE Transactions on Microwave Theory and Techniques, vol. 54, no. 1, pp. 481-491, Jan. 2006.   DOI
17 P. D. Hale, C. M. Wang, D. F. Williams, K. A. Remley, and J. D. Wepman, "Compensation of random and systematic timing errors in sampling oscilloscopes," IEEE Transactions on Instrumentation and Measurement, vol. 55, no. 6, pp. 2146-2154, Dec. 2006.   DOI
18 C. Cho, J. G. Lee, T. W. Kang, and N. W. Kang, "Calibration and uncertainty analysis of sample-time error on high jitter of samplers," Journal of Electromagnetic Engineering and Science, to be publshed.
19 A. Lewandowski, D. F. Williams, P. D. Hale, J. C. M. Wang, and A. Dienstfrey, "Covariance-based vector-network-analyzer uncertainty analysis for time- and frequency-domain measurements," IEEE Transactions on Microwave Theory and Techniques, vol. 58, no. 7, pp. 1877-1886, Jul. 2010.   DOI
20 G. A. F. Seber, C. J. Wild, Nonlinear Regression, Hoboken, NJ, John Wiley & Sons, 2003, pp. 127-190.