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http://dx.doi.org/10.5515/KJKIEES.2014.25.2.199

HEMP Effect Analysis for Equipment Using Comparison of Norms between HEMP Filter Residual Current and Conducted Susceptibility Criteria  

Kwon, Joon-Hyuck (Agency for Defense Development)
Song, Ki-Hwan (Agency for Defense Development)
Yook, Jong-Gwan (Department of Electrical and Electronic Engineering, Yonsei University)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.25, no.2, 2014 , pp. 199-207 More about this Journal
Abstract
Although High-altitude electromagnetic pulse(HEMP) protection filter meets the requirements of pulsed current injection(PCI) acceptance test, the equipment under test which has low electromagnetic susceptibility level can be damaged during PCI verification test that is performed on operating condition of equipment. This paper proposed the HEMP effect analysis method using comparison of norms between residual current of HEMP filter and transient electromagnetic conducted susceptibility criteria of equipment, as an alternative method under the condition that performing PCI verification test is limited in HEMP hardened facilities. PCI acceptance test of HEMP filter, transient electromagnetic conducted susceptibility test, and PCI verification test are performed and test results are analyzed.
Keywords
HEMP(High-Altitude Electromagnetic Pulse); HEMP Filter; Pulsed Current Injection(PCI); Transient Electromagnetic Conducted Susceptibility;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
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