Browse > Article
http://dx.doi.org/10.5515/KJKIEES.2014.25.2.183

Analysis on the Propagated Uncertainty of Output Power of Class-F Power Amplifiers from DC Biasing and Its Optimization  

Park, Youngcheol (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Yoon, Hoijin (Department of Computer Science and Engineering, Hyupsung University)
Publication Information
Abstract
In this paper, the propagation effect of power supply uncertainty on the output of class-F power amplifier has been estimated. Also, a 1.9 GHz, 10 watt class-F power amplifier was measured to verify the estimation and to find the optimal biasing point. By approximating the propagation theory of uncertainties, the propagation effect of bias uncertainty was mathmatically calculated. As a result, the DC biases have propagated uncertainties of 15~70 mW. However, at the optimized bias point, the uncertainty in the output power could be dropped less than 15 mW while the output power has dropped by 0.37 dB.
Keywords
Uncertainty; Power Amplifier; Propagation of Uncertainty;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Y. Park, "Analysis and control of uncertainty in wireless transmitting devices", in SecTech/CA/CES-CUBE 2012, Jeju, vol. 339, pp. 438-445, 2012.
2 K. B. Schaub, J. Kelly, Production Testing for RF and System-on-a-Chip Devices for Wireless Communications, Artech House, pp. 33-93, 2004.
3 Rodhe & Schwartz(2012, Mar.). RF Level Measurement Uncertainties with the Measuring Receiver R&S FSMR. [Online], Available: http://www2.rohde-schwarz.com/file/1MA92_0e.pdf
4 Swanzy, Joe, "Impact of VSWR on the uncertainty analysis of harmonics for a scope calibrator instrument", in Proc. of Workshop and Symp. of National Conf. and Standards Laboratories, pp. 663-670, 2002.
5 Y. Park, "Class-F technique as applied to active frequency multiplier designs", IEEE Trans. Microwave Theory and Tech., vol. 57, no. 12, pp. 3212-3218, Dec. 2009.   DOI
6 JCGM : "Evaluation of measurement data: Guide to the expression of uncertainty in measurement", Technical Document, 100:2008, 2008.