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http://dx.doi.org/10.5515/KJKIEES.2013.24.9.892

Precise Measurements of Waveguide Scattering Parameters in G-Band  

Kang, Jin-Seob (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kim, Jeong-Hwan (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Cho, Chihyun (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kim, Dae-Chan (Center for Electromagnetic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Publication Information
Abstract
This paper discusses difficulties in precise measurements of the scattering parameters in (sub-)millimeter-wave range and tips for more accurate measurements, and provides measurement examples in the G-band(140~220 GHz). First, one investigates the differences in operating principles of scattering parameters measurement systems used in microwave and (sub-)millimeter-wave ranges and describes tips for better operation of the (sub-)millimeter-wave scattering parameters measurement system. In addition, one describes tips for better transmission properties and connection repeatability of waveguides and a precise measurement method for devices with small reflection coefficients.
Keywords
Waveguide Measurement; Scattering Parameters; (sub-)Millimeter-Wave; G-Band;
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Times Cited By KSCI : 1  (Citation Analysis)
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