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http://dx.doi.org/10.5515/KJKIEES.2013.24.6.633

Novel Extraction Method for Unknown Chip PDN Using De-Embedding Technique  

Kim, Jongmin (School of Information and Communication Engineering, Sungkyunkwan University)
Lee, In-Woo (Samsung Electronics)
Kim, Sungjun (School of Information and Communication Engineering, Sungkyunkwan University)
Kim, So-Young (School of Information and Communication Engineering, Sungkyunkwan University)
Nah, Wansoo (School of Information and Communication Engineering, Sungkyunkwan University)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.24, no.6, 2013 , pp. 633-643 More about this Journal
Abstract
GDS format files, as well as layout of the chip are noticeably needed so as to analyze the PDN (Power Delivery Network) inside of IC; however, commercial IC in the market has not supported design information which is layout of IC. Within this, in terms of IC having on-chip PDN, characteristic of inside PDN of the chip is a core parameter to predict generated noise from power/ground planes. Consequently, there is a need to scrutinize extraction method for unknown PDN of the chip in this paper. To extract PDN of the chip without IC circuit information, the de-embedding test vehicle is fabricated based on IEC62014-3. Further more, the extracted inside PDN of chip from de-embedding technique adopts the Co-simulation model which composes PCB, QFN (Quad-FlatNo-leads) Package, and Chip for the PDN, applied Co-simulation model well corresponds with impedance from measured S-parameters up to 4 GHz at common measured and simulated points.
Keywords
Power Delivery Network; Power Integrity; Debye Model; TLM; Coupled Noise;
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