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http://dx.doi.org/10.5515/KJKIEES.2013.24.4.436

Evaluation of IC Electromagnetic Conducted Immunity Test Methods Based on the Frequency Dependency of Noise Injection Path  

Kwak, SangKeun (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Kim, SoYoung (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.24, no.4, 2013 , pp. 436-447 More about this Journal
Abstract
In this paper, Integrated circuit(IC) electromagnetic(EM) conducted immunity measurement and simulation using bulk current injection(BCI) and direct power injection(DPI) methods were conducted for 1.8 V I/O buffers. Using the equivalent circuit models developed for IC electromagnetic conducted immunity tests, we investigated the reliability of the frequency region where IC electromagnetic conducted immunity test is performed. The insertion loss for the noise injection path obtained from the simulation indicates that using only one conducted immunity test method cannot provide reliable conducted immunity test for broadband noise. Based on the forward power results, we analyzed the actual amount of EM noise injected to IC. We propose a more reliable immunity test methods for broad band noise.
Keywords
Electromagnetic Conducted Immunity; Equivalent Circuit Model;
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  • Reference
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