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http://dx.doi.org/10.5515/KJKIEES.2012.23.8.967

3.5 mm Coaxial One Port Vector Network Analysis Using Time Domain Reflectometry  

Lee, Dong-Joon (Center for Electromagnetic Wave, Korea Research Institute of Standards and Science)
Kwon, Jae-Yong (Center for Electromagnetic Wave, Korea Research Institute of Standards and Science)
So, Joon-Ho (Agency for Defense Development)
Kang, No-Weon (Center for Electromagnetic Wave, Korea Research Institute of Standards and Science)
Publication Information
Abstract
This paper presents a method to measure reflection coefficients of microwave devices or antennas based on time domain analysis with sampling oscilloscopes. The reflection coefficients were extracted by the Fourier transformation of echo pulses from devices with respect to the 20 GHz incident pulse signals. The three-error terms, which are commonly used for the correction of a microwave network, were determined using a 3.5 mm calibration kit. In addition, a modified error-correction model associated with a directional coupler for reflection coefficient measurements is introduced. The results were compared with those of measured with a commercial vector network analyzer.
Keywords
Oscilloscope; Reflection Coefficient Measurement; Vector Network Analyzer;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 "Time domain analysis using a network analyzer", Application Note 1287-12, Agilent Technologies, 2007.
2 "Applying error correction to network analyzer measurements", Application Note 1287-3, Agilent Technologies, 1999.
3 D. J. Lee, J. Y. Kwon, J. S. Kang, and J. F. Whitaker, "Vector network analysis using a one-path, frequency- multiplied photonic link", Journal of Korean Institute of Electromagnetic Engineering and Science, vol. 10, no. 4, pp. 282-289, Dec. 2010.   DOI
4 D. J. Lee, J. Y. Kwon, and J. G. Lee, "Spectrotemporal mismatch analysis of a transmission line based on on-wafer optical sampling", Progress in Electromagnetics Research Letters, vol. 30, pp. 153- 162, Mar. 2012.   DOI