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http://dx.doi.org/10.5515/KJKIEES.2009.20.2.115

A Parasitic Elements Extraction of the Distributed Elements and an Application of the BPF Using the Short-Open Calibration Method  

Kim, Yu-Seon (Department of Electronics Engineering, Chonnam National University)
Nam, Hun (LG-Nortel)
Lim, Yeong-Seog (Department of Electronics Engineering, Chonnam National University)
Publication Information
Abstract
In this paper, we extract the parasitic elements of the transmission line with the defected ground structure(DGS) and the short-circuited comb line section using the Short-Open Calibration(SOC). The scattering matrixes of short, open and the distributed elements in microstrip line are measured by full electro-magnetic(EM) simulator and Vector Network Analyser(VNA). The electro-magnetic effects of the proposed structures are considered by the II and T equivalent circuits with frequency independent elements, and the relations between the measured scattering parameters and the elements in the circuits are shown by performing 2 port network analysis. Moreover, to design the 2.4 GHz bandpass filter with second order butterworth prototype, the proposed methods are applied. As results, the measured $S_{11}$ and $S_{21}$ indicate -20 dB and -1.3 dB at center frequency, and these are shown within 5 % error compare to the predicted results at $0.5{\sim}5\;GHz$.
Keywords
Short-Open Calibration; Microstrip Coupled Line; Defected Ground Structure; BPF;
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Times Cited By KSCI : 1  (Citation Analysis)
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