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http://dx.doi.org/10.5515/KJKIEES.2009.20.1.091

Standard Field Generation Using a Micro-TEM Cell and Its Measurement Uncertainty Evaluation  

Kang, Jin-Seob (Center for Electromagentic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kim, Jeong-Hwan (Center for Electromagentic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kang, Ung-Taek (Center for Electromagentic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kang, No-Weon (Center for Electromagentic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Kang, Tae-Weon (Center for Electromagentic Wave, Division of Physical Metrology, Korea Research Institute of Standards and Science(KRISS))
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.20, no.1, 2009 , pp. 91-99 More about this Journal
Abstract
In this paper, a standard field generation method using a micro-TEM ceil is described and its measurement uncertainty is evaluated. The standard field generation system consists of an auto-leveling signal source, a micro-TEM cell operating up to 1.2 GHz, and a power measuring Instrument using a thermistor mount. Measurement results of a field strength key comparison (CCEM.RF-K20) for the field strength of 20 V/m at frequencies between 10 MHz and 1 GHz are presented for validating the standard field generation method.
Keywords
Field Strength; Micro-TEM Cell; Standard Field Generation;
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