Design and Fabrication of K-band Attenuation Standard |
Lee Joo-Gwang
(Electromagenetic Metrology Group, Korea Research Institute of Standards and Science)
Kim Jeong-Hwan (Electromagenetic Metrology Group, Korea Research Institute of Standards and Science) Kang Jin-Seob (Electromagenetic Metrology Group, Korea Research Institute of Standards and Science) Kang Tae-Weon (Electromagenetic Metrology Group, Korea Research Institute of Standards and Science) |
1 | C. D. Ehrlich, S. D. Rasberry, 'Metrological timelines in traceability', Metrologia, vol. 34, pp. 503-514, 1997 DOI ScienceOn |
2 | Joo-Gwang Lee, Jeong-Hwan Kim, Jeong-IL Park, and Ung-Taeg Kang, 'Uncertainty evaluation of a broadband attenuation standard', IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 2, pp. 705-708, Apr. 2005 DOI ScienceOn |
3 | R. Yell, 'Traceability-The national roles', IEE Colloquium on Accreditation of RF Measurement, London, UK, pp. 2/1-2/4, Feb. 1993 |
4 | BIPM Key Comparison Database Appendix-C, Calibration and Measurement Capabilities of National Metrology Institutes, http://kcdb.bipm.fr/ appendixC |
5 | H. Bayer, 'An error analysis for the RF-attenuation measuring equipment of the PTB applying the power method', Metrologia, vol. 11, pp. 43-51, 1975 DOI ScienceOn |
6 | Agilent Technologies, Fundamentals of RF and Microwave Power Measurements, Agilent Technologies, Palo Alto, CA, Application Note 64-1C, p. 20, 2001 |
7 | D. H. Russel, 'The waveguide below-cutoff attenuation standard', IEEE Transactions on Microwave Theory and Techniques, vol. 45, no. 12, pp. 2408-2413, Dec. 1997 |
8 | J. A. Jargon, R. A. Ginley, and D. D. Sutton, 'The NIST 30 MHz linear measurement system', Journal of Research of the NIST, vol. 99, no. 1, pp. 19-30, Jan.-Feb. 1994 DOI ScienceOn |
9 | KRISS-99-070-SP, 측정불확도 표현 지침, 한국표준과학연구원, 1999년 |
10 | F. L. Warner, Microwave Attenuation Measurement, Peter Peregrinus Ltd., pp. 119-131, 1977 |