Browse > Article

Design of Miniaturized Microwave Amplifier Using Capacitively-Coupled Match Circuit(CCMC) under Conditionally Stable State  

Ryu, Seung-Kab (national Security Research Institute)
Hwang, In-Ho (National Security Research Institute)
Kim, Yong-Hoon (Department of Mechtronics Engineering, GIST)
Publication Information
Abstract
In the paper, we suggest a simpler synthesis technique for capacitively-coupled match circuit(CCMC) which have a function of DC block and impedance matching simultaneously, and introduce a stability margin analysis technique for designing microwave amplifier under conditionally stable state. Stability margin analysis is used to determine optimum match point that ensure maximum gain under the given stability margin. It can reduce time consuming work for selecting match points in the conditionally stable state. Also, suggested miniaturization scheme of matching network is distinguished from previous work with respect to reducing deterministic parameters for CCMC synthesis. To verify utility of suggested method, 24 GHz gain block is fabricated under conditionally stable state using an internal thin-film fabrication process, Measured results show a stable gain of 10 dB and flatness of 1 dB, which is well coincident with simulated one.
Keywords
Capacitively-Coupled Match Circuit; Stability Margin; Conditionally-Stable Amplifier;
Citations & Related Records
연도 인용수 순위
  • Reference
1 H. Uchida, 'Miniaturized millimeter-wave HMIC amplifiers using capacitively-coupled matching circuits and FETs with resistive source stubs', IEICE Trans. Electronics, vol. E82-C, no. 11, pp. 2087-2093, 1999
2 M. L. Edwards, 'A deterministic approach for conditionally stable amplifiers', IEEE Trans. on Microwave and Tech., vol. 43, no. 7, pp. 1567-1575, Jul. 1995   DOI   ScienceOn
3 M. L. Edward, 'Conditionally stable amplifier design using constant u-contours', IEEE MTT-S Digest, pp. 863-866, 1996
4 K. W. Eccleston, 'Design formulae for microwave amplifiers employing conditionally-stable transistors', IEICE Trans. on Electron, vol. E82-C, no. 7, pp. 1054-1060, 1999