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New Challenges for Low Cost and High Speed RF ATE System  

Song, Ki-Jae (RF System Lab., ASE Korea, Inc., Department of Radio Science and Engineering, Kwangwoon University)
Lee, Ki-Soo (RF System Lab., ASE Korea, Inc.)
Park, Jongsoo (RF System Lab., ASE Korea, Inc.)
Lee, Jong-Chul (Department of Radio Science and Engineering, Kwangwoon University)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.15, no.8, 2004 , pp. 744-751 More about this Journal
Abstract
This paper presents the implementation of the low cost and high speed RF ATE(Automatic Test Equipment) system, which can be a reasonable solution for reducing the test cost of RF devices. This paper suggests high speed and precise measurement capabilities which are realized by the 16 independent RF ports with high speed switching time and high accuracy digitizer using the industry standard Versus module eXtensions for Instrument(VXI) General Purpose Interface Bus(GPIB) interfaces. Also, the system has the capabilities of quad-site test which can dramatically increase the device throughput. This paper concludes with the demonstration of the implemented ATE system through the setup of RF Power Amplifier Module(PAM), which is under the most competitive market situation.
Keywords
ATE; Test; Receiver; PAM; VXI;
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  • Reference
1 /
[ M. Burns;G. W. Roberts ] / An Introduction to Mixed-Signal IC Test and Measurement
2 /
[ J. S. Lee;L. E. Miller ] / CDMA Systems Engineering Handbook
3 /
[ H. T. Friis ] / Proc. IRE   DOI
4 /
[ E. C. Ifeachor;B. W. Jervis ] / Digital Signal Processing(2nd Ed.)
5 /
[ W. H. Press;S. A. Teukolsky;W. T. Vetterling;B. P. Flannery ] / Numerical Recipes in <TEX>$C^{++}$</TEX>(2nd Ed.)