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Measurement-Based Large-Signal Simulation of Active Components from Automated Non-Liner Vector Network Analyzer Data via X-parameters  

Horn, Jason (Agilent Technologies, Inc.)
Gunyan, Daniel (Agilent Technologies, Inc.)
Betts, Loren (Agilent Technologies, Inc.)
Gillease, Chad (Agilent Technologies, Inc.)
Verspecht, Jan (Jan Verspecht, b.v.b.a.)
Root, David E. (Agilent Technologies, Inc.)
Publication Information
The Proceeding of the Korean Institute of Electromagnetic Engineering and Science / v.24, no.3, 2013 , pp. 67-72 More about this Journal
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