Browse > Article
http://dx.doi.org/10.4313/JKEM.2022.35.5.11

Eloctrostatic Electrification Properties of Silicone Rubber in the Presence of Pt Flame Retardant  

Lee, Sung Ill (Department of Safety Engineering, Korea National University of Transportation)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.35, no.5, 2022 , pp. 494-498 More about this Journal
Abstract
In this study, SiO2 20 phr, ATH 70 phr, and platinum flame retardant were mixed with raw silicone rubber and -10 kV was applied to measure electrostatic charge attenuation voltage, surface resistance, and volume resistance, and the following conclusions were obtained. When the platinum flame retardant was 0 phr, the humidity 74.6% and the temperature was 21.8℃, the potential was half-reduced to 0.63 kV, 0.57 kV, and 0.44 kV when the applied voltage was changed from -10 kV to -8 kV, and the time halved to 50% was increased to 2.40 seconds, 2.47 seconds, and 2.61 seconds. It was confirmed that as the platinum flame retardant increased from 0.1 to 0.3 phr, the potential half-reduced to 0.67 kV, 0.60 kV, and 0.595 kV decreased, and the charge potential attenuation time half-reduced to 50% decreased to 3.44 seconds, 1.78 seconds, and 1.60 seconds. It was confirmed that the surface resistance increased as the humidity decreased, and the volume resistance decreased as the platinum flame retardant increased.
Keywords
Platinum flame retardant; Electrostatic charge attenuation voltage; Volume resistance;
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. K. Park, W. S. Lee, and J. H. Han, J. Korean Inst. Electr. Electron. Mater. Eng., 14, 397 (2001).
2 J. Montesinos, R. S. Gorur, L. Zimmer, and N. F. Hubele, IEEE Trans. Dielectr. Electr. Insul., 7, 408 (2000). [DOI: https://doi.org/10.1109/94.848927]   DOI
3 S. Kumagal and N. Yoshimura, IEEE Trans. Dielectr. Electr. Insul., 7, 424 (2000). [DOI: https://doi.org/10.1109/94.848931]   DOI
4 J. M. Zeigler and F. W. Gordon Fearon, Silicone-Based Polymer Science: A Comprehensive Resource (Oxford University Press, Washington, 1990) p. 47.
5 K. Lee, J. Yoo, J. Hong, S. Lee, Y. Kim, and H. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 20, 25 (2007).
6 W. Lynchch, D. Greason, and S. Bulach, IEEE Trans. Ind. Appl., 33, 286 (1997).