Structural and Electrical Properties of K(Ta,Nb)O3 Ceramics with Variation of Ag Contents for Electrocaloric Devices |
Lee, Min-Sung
(Department of Ceramics Engineering, School of Materials Science and Engineering, Gyeongsang National University)
Park, Byeong-Jun (Research Institute for Green Energy Convergence Technology, Department of Materials Engineering and Convergence Technology, Gyeongsang National University) Lim, Jeong-Eun (Research Institute for Green Energy Convergence Technology, Department of Materials Engineering and Convergence Technology, Gyeongsang National University) Lee, Sam-Haeng (Research Institute for Green Energy Convergence Technology, Department of Materials Engineering and Convergence Technology, Gyeongsang National University) Lee, Myung-Gyu (Research Institute for Green Energy Convergence Technology, Department of Materials Engineering and Convergence Technology, Gyeongsang National University) Park, Joo-Seok (Business Support Division, Korea Institute of Ceramic Engineering and Technology) Lee, Sung-Gap (Department of Ceramics Engineering, School of Materials Science and Engineering, Gyeongsang National University) |
1 | J. H. Yoo and S. J. Cho, Trans. Electr. Electron. Mater., 20, 36 (2019). [DOI: https://doi.org/10.1007/s42341-018-00090-7] DOI |
2 | A. S. Mischenko, Q. Zhang, J. F. Scott, R. W. Whatmore, and N. D. Mathur, Science, 311, 1270 (2006). [DOI: https://doi.org/10.1126/science.1123811] DOI |
3 | X. Yan, M. Zhu, Q. Wei, S. G. Lu, M. Zheng, and Y. Hou, Scripta Mater., 162, 256 (2019). [DOI: https://doi.org/10.1016/j.scriptamat.2018.11.007] DOI |
4 | S. Guillemet-Fritsch, C. Chanel, J. Sarrias, S. Bayonne, A. Rousset, X. Alcobe, and M. L. Martinez Sarrion, Solid State Ionics, 128, 233 (2000). [DOI: https://doi.org/10.1016/S0167-2738(99)00340-9] DOI |
5 | B. Liu, H. Zhang, Y. Zhang, X. Lv, Y. Yang, L. Wei, X. Wang, H. Yu, C. Zhang, and J. Li, Acta Phys. Pol., A, 135, 396 (2019). [DOI: https://doi.org/10.12693/APhysPolA.135.396] DOI |
6 | D. J. Lee, S. G. Lee, K. M. Kim, and M. S. Kwon, Trans. Electr. Electron. Mater., 18, 261 (2017). [DOI: https://doi.org/10.4313/TEEM.2017.18.5.261] DOI |
7 | W. Geng, Y. Liu, X. Meng, L. Bellaiche, J. F. Scott, B. Dkhil, and A. Jiang, Adv. Mater., 27, 3165 (2015). [DOI: https://doi.org/10.1002/adma.201501100] DOI |
8 | D. Fu, M. Itoh, and S. Y. Koshihara, J. Appl. Phys., 106, 104104 (2009). [DOI: https://doi.org/10.1063/1.3259410] DOI |
9 | S. P. Alpay, J. Mantese, S. Trolier-McKinstry, Q. Zhang, and R. W. Whatmore, MRS Bull., 39, 1099 (2014). [DOI: https://doi.org/10.1557/mrs.2014.256] DOI |
10 | M. Kwon, S. Lee, K. Kim, and S. Choi, J. Cer. Proc. Res., 20, 395 (2019). DOI |
11 | Y. Matsushita, A. Nochida, T. Yoshimura, and N. Fujimura, Jpn. J. Appl. Phys., 55, 10TB04 (2016). [DOI: https://doi.org/10.7567/JJAP.55.10TB04] DOI |