1 |
J. Y. Lee, S. J. Lee, T. W. Kim, and I. Yu, J. Korean Inst. Electr. Electron. Mater. Eng., 24, 27 (2011). [DOI: https://doi.org/10.4313/JKEM.2011.24.1.27]
DOI
|
2 |
N. J. Findlay, J. Bruckbauer, A. R. Inigo, B. Breig, S. Arumugam, D. J. Wallis, R. W. Martin, and P. J. Skabara, Adv. Mater., 26, 7290 (2014). [DOI: https://doi.org/10.1002/adma.201402661]
DOI
|
3 |
S. Y. Cho and J. W. Song, J. Inst. Electron. Inf. Eng., 51, 167 (2014). [DOI: http://doi.org/10.5573/ieie.2014.51.8.167]
DOI
|
4 |
C. Huang, S. Barlow, and S. R. Marder, J. Org. Chem., 76, 2386 (2011). [DOI: https://doi.org/10.1021/jo2001963]
DOI
|
5 |
S. Stappert, C. Li, K. Mullen, and T. Basche, Chem. Mater., 28, 906 (2016). [DOI: https://doi.org/10.1021/acs.chemmater.5b04602]
DOI
|
6 |
T. Heek, F. Wurthner, and R. Haag, Chem. Eur. J., 19, 10911 (2013). [DOI: https://doi.org/10.1002/chem.201300556]
DOI
|
7 |
K. S. Park and Y. T. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 24, 398 (2011). [DOI: https://doi.org/10.4313/JKEM.2011.24.5.398]
DOI
|
8 |
S. M. Lee and Y. T. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 30, 48 (2017). [DOI: https://doi.org/10.4313/JKEM.2017.30.1.48]
DOI
|
9 |
Y. D. Kim and C. S. Ko, Econ. Environ. Geol., 43, 505 (2010).
|
10 |
F. Nolde, W. Pisula, S. Muller, C. Kohl, and K. Mullen, Chem. Mater., 18, 3715 (2006). [DOI: https://doi.org/10.1021/cm060742c]
DOI
|
11 |
S. B. Jung and Y. T. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 32, 86 (2019). [DOI: https://doi.org/10.4313/JKEM.2019.32.1.86]
DOI
|
12 |
B. H. Jeong, N. O. Kim, D. G. Kim, G. G. Oh, G. B. Cho, and K. Y. Lee, J. Korean Inst. Illum. Electr. Install. Eng., 23, 23 (2009). [DOI: https://doi.org/10.5207/JIEIE.2009.23.12.023]
|
13 |
Y. J. Sim, I. T. Kim, and A. S. Choi, J. Korean Inst. Illum. Electr. Install. Eng., 29, 1 (2015). [DOI: https://doi.org/10.5207/JIEIE.2015.29.1.001]
|