Research for Hot Carrier Degradation in N-Type Bulk FinFETs |
Park, Jinsu
(Department of Electrical and Computer Engineering, Sungkyunkwan University)
Showdhury, Sanchari (Department of Electrical and Computer Engineering, Sungkyunkwan University) Yoon, Geonju (Department of Electrical and Computer Engineering, Sungkyunkwan University) Kim, Jaemin (Department of Electrical and Computer Engineering, Sungkyunkwan University) Kwon, Keewon (Department of Electrical and Computer Engineering, Sungkyunkwan University) Bae, Sangwoo (Technology Quality & Reliability Foundry Division, Samsung Electronics Co., LTD.) Kim, Jinseok (Technology Quality & Reliability Foundry Division, Samsung Electronics Co., LTD.) Yi, Junsin (Department of Electrical and Computer Engineering, Sungkyunkwan University) |
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