1 |
P. Paplinski and J. Wankowicz, IEEE Trans. Dielectr. Electr. Insul., 23, 3458 (2016). [DOI: https://doi.org/10.1109/TDEI.2016.005873]
DOI
|
2 |
F. M. Frigura-lliasa, S. Musuroi, C. Sorandaru, and D. Vatau, Energies, 12, 536 (2019). [DOI: https://doi.org/10.3390/en12030536]
DOI
|
3 |
Y. Tsujimoto, N. Tsukamoto, R. Tsuge, and Y. baba, Proc. 2018 34th International Conference on Lightning Protection (ICLP) (IEEE, Rzeszow, Poland, 2018) p. 46. [DOI: https://doi.org/10.1109/ICLP.2018.8503337]
|
4 |
K. S. Park, G. Wang, S. C. Hwang, S. J Kim, and G. S. Kil, J. Korean Inst. Electr. Electron. Mater. Eng., 29, 635 (2016). [DOI:https://doi.org/10.4313/JKEM.2016.29.10.635]
DOI
|
5 |
G. Wang, S. J. Kim, S. J. Park, G. S. Kil, and H. K. Ji, Trans. Electr. Electron. Mater., 17, 289 (2016). [DOI: https://doi.org/10.4313/TEEM.2016.17.5.289]
DOI
|
6 |
G. Wang, W. H. Kim, J. H. Lee, and G. S. Kil, J. Electr. Eng., 69, 352 (2018). [DOI: https://doi.org/10.2478/jee-2018-0051]
DOI
|
7 |
W. H. Kim, S. C. Hwang, G. Wang, G. S. Kil, and C. H. Ahn, J. Korean Inst. Electr. Electron. Mater. Eng., 30, 12 (2017). [DOI: http://doi.org/10.4313/JKEM.2017.30.12.817]
|
8 |
IEC, IEC 61643-11: Low-Voltage Surge Protective Devices Part11: Surge Protective Devices Connected to Low-Voltage Power Distribution Systems - Requirements and Tests, 2nd ed (IEC, Geneva, 2011) p. 12.
|
9 |
IEC, IEC 61000-4-5: Testing and measurement techniques - Surge immunity test (IEC, Geneva, 2010) p. 23
|
10 |
D. Miller, R. Kennel, M. Reddig, and M. Schlenk, Proc. 2016 IEEE International Telecommunications Energy Conference (INTELEC) (IEEE, Austin, USA, 2016) p. 52. [DOI: https://doi.org/10.1109/intlec.2016.7749027]
|