Research Trends for Improvement of NBIS Instability in Amorphous In-Ga-ZnO Based Thin-Film Transistors |
Yoon, Geonju
(Department of Electrical and Computer Engineering, Sungkyunkwan University)
Park, Jinsu (Department of Electrical and Computer Engineering, Sungkyunkwan University) Kim, Jaemin (Department of Electrical and Computer Engineering, Sungkyunkwan University) Cho, Jaehyun (Department of Electrical and Computer Engineering, Sungkyunkwan University) Bae, Sangwoo (Technology Quality & Reliability Foundry Division Samsung Electronics Co., LTD.) Kim, Jinseok (Technology Quality & Reliability Foundry Division Samsung Electronics Co., LTD.) Kim, Hyun-Hoo (Department of Display Engineering, Doowon Technical University) Yi, Junsin (Department of Electrical and Computer Engineering, Sungkyunkwan University) |
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