1 |
Y. Kayano and H. Inoue, Proc. 27th International Conference on Electrical Contacts (Akita University, Akita, 2014) p. 635.
|
2 |
S. H. Choi, K. S. Kim, J. M. Ryu, and C. S. Huh, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 115 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.2.115]
DOI
|
3 |
A. Vassa, E. Carvou, S. Rivoirard, L. Doublet, C. Bourda, D. Jeannot, P. Ramoni, N. Ben Jemaa, and D. Givord, Proc. 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (IEEE, Charleston, 2010) p. 1.
|
4 |
J. Sekikawa and T. Kubono, Proc. 2008 Proceedings of the 54th IEEE Holm Conference on Electrical Contacts (IEEE, Orlando, 2008) p. 21.
|
5 |
J. Sekikawa, N. Ban, and T. Kubono, Proc. 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (IEEE, Charleston, 2010) p. 1.
|
6 |
K. Yoshida, K. Sawa, K. Suzuki, M. Watanabe, and H. Daijima, Proc. 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) (IEEE, Minneapolis, 2011) p. 1.
|