1 |
N. K. Kim, Y. H. Min, S. Noh, E. Cho, G. Jeong, M. Joo, S. W. Ahn, J. S. Lee, S. Kim, K. Ihm, H. Ahn, Y. Kang, H. S. Lee, and D. Kim, Sci. Rep., 7, 4645 (2017). [DOI: https://doi.org/10.1038/s41598-017-04690-w]
DOI
|
2 |
M. Gratzel, Nat. Mater., 13, 838 (2014). [DOI: https://doi.org/10.1038/nmat4065]
DOI
|
3 |
Y. Zhao and K. Zhu, Chem. Soc. Rev., 45, 655 (2016). [DOI: https://doi.org/10.1039/C4CS00458B]
DOI
|
4 |
R. J. Sutton, G. E. Eperon, L. Miranda, E. S. Parrott, B. A. Kamino, J. B. Patel, M. T. Horantner, M. B. Johnston, A. A. Haghighirad, D. T. Moore, and H. J. Snaith, Adv. Energy Mater., 6, 1502458 (2016). [DOI: https://doi.org/10.1002/aenm.201502458]
DOI
|
5 |
G. E. Eperon, S. D. Stranks, C. Menelaou, M. B. Johnston, L. M. Herz, and H. J. Snaith, Energy Environ. Sci., 7, 982 (2014). [DOI: https://doi.org/10.1039/C3EE43822H]
DOI
|
6 |
B. Conings, J. Drijkoningen, N. Gauquelin, A. Babayigit, J. D'Haen, L. D'Olieslaeger, A. Ethirajan, J. Verbeeck, J. Manca, E. Mosconi, F. D. Angelis, and H. G. Boyen, Adv. Energy Mater., 5, 1500477 (2015). [DOI: https://doi.org/10.1002/aenm.201500477]
DOI
|
7 |
M. Liu, M. B. Johnston, and H. J. Snaith, Nature, 501, 395 (2013). [DOI: https://doi.org/10.1038/nature12509]
DOI
|
8 |
Z. Xiao, Q. Dong, C. Bi, Y. Shao, Y. Yuan, and J. Huang, Adv. Mater., 26, 6503 (2014). [DOI: https://doi.org/10.1002/adma.201401685]
DOI
|
9 |
Y. J. Kim, T. V. Dang, H. J. Choi, B. J. Park, J. H. Eom, H. A Song, D. Seol, Y. Kim, S. H. Shin, J. Nah, and S. G. Yoon, J. Mater. Chem. A, 4, 756 (2015). [DOI: https://doi.org/10.1039/C5TA09662F]
DOI
|
10 |
D. Weber, Z. Naturforsch., B: Chem. Sci., 33, 1443 (1978). [DOI: https://doi.org/10.1515/znb-1978-1214]
DOI
|
11 |
A. Poglitsch and D. Weber, J. Chem. Phys., 87, 6373 (1987). [DOI: https://doi.org/10.1063/1.453467]
DOI
|
12 |
S. Luo and W. A. Daoud, Materials, 9, 123 (2016). [DOI:https://doi.org/10.3390/ma9030123]
DOI
|
13 |
R. F. Egerton, P. Li, and M. Malac, Micron, 35, 399 (2004). [DOI: https://doi.org/10.1016/j.micron.2004.02.003]
DOI
|
14 |
S. B. Vendelbo, P. J. Kooyman, J. F. Creemer, B. Morana, L. Mele, P. Dona, B. J. Nelissen, and S. Helveg, Ultramicroscopy, 133, 72 (2013). [DOI: https://doi.org/10.1016/j.ultramic.2013.04.004]
DOI
|
15 |
C. Colliex, Science, 347, 611 (2015). [DOI: https://doi.org/10.1126/science.aaa5311]
DOI
|
16 |
R. F. Egerton, Micron, 34, 127 (2003). [DOI: https://doi.org/10.1016/S0968-4328(03)00023-4]
DOI
|
17 |
K. P. Ong, T. W. Goh, Q. Xu, and A. Huan, J. Phys. Chem. Lett., 6, 681 (2015). [DOI: https://doi.org/10.1021/jz502740d]
DOI
|
18 |
G. R. Kumar, A. D. Savariraj, S. N. Karthick, S. Selvam, B. Balamuralitharan, H. J. Kim, K. K. Viswanathan, M. Vijaykumarc, and K. Prabakar, Phys. Chem. Chem. Phys., 18, 7284 (2016). [DOI: https://doi.org/10.1039/C5CP06232B]
DOI
|
19 |
B. D. Cullity and S. R. Stock, Elements Of X-Ray Diffraction (Addition-Wesley, Boston, 1978) p. 26.
|
20 |
T. Supasai, N. Rujisamphan, K. Ullrich, A. Chemseddine, and T. Dittrich, Appl. Phys. Lett., 103, 183906 (2013). [DOI:https://doi.org/10.1063/1.4826116]
DOI
|