Browse > Article
http://dx.doi.org/10.4313/JKEM.2018.31.4.261

Analysis of Leakage Current Diagnosis According to Online and Offline Conditions  

Han, Kyung-Chul (Department of Electrical Engineering, DongShin University)
Lee, Gyeong-Seop (Department of Electrical Engineering, DongShin University)
Choi, Yong-Sung (Department of Electrical Engineering, DongShin University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.31, no.4, 2018 , pp. 261-266 More about this Journal
Abstract
When the clamp meter approaches the electric path where current is flowing, leakage current can be measured at a distance from the electric current because the induced current increases as the magnitude of the current increases and approaches nearer to the electric path. Therefore, measurements were carried out from a distance to avoid this effect. In addition, the measured values differ depending on the location of the power line that penetrates the ZCT of the clamp meter, thus measurements were performed at a location where this effect was minimized. The fraction of compliant branch circuits, whose leakage current was lower than 1.00 mA, was found to be 69.0% out of the total of 439 branch circuits, while the percentage of compliant branch circuits having an insulation resistance higher than $0.20M{\Omega}$ was found to be 93.2%. The reason why the percentage of compliant branch circuits with low leakage current was low might be due to the inclusion of capacitive leakage current in the total measured leakage current.
Keywords
Clamp meter; Leakage current; ZCT; Insulation resistance;
Citations & Related Records
연도 인용수 순위
  • Reference
1 B. I. Bae, Master, Thesis, p. 2-57, Hanyang University, Seoul (2005).
2 Y. B. Lim, J. W. Jung, J. S. Jung, and S. W. Cho, 2006 Spring Conference (Korean Inst. Illuminating & Elect. Installation Eng., Korea, 2006) p. 260.
3 D. W. Kim, Y. B. Lim, S. I. Lee, J. H. Kim, and D. C. Kang, J. Korean Inst. Illuminating & Elect. Installation Eng., 27, 82 (2013). [DOI: http://dx.doi.org/10.5207/JIEIE. 2013.27.6.082]
4 N. K. Joo, T. W. Kim, and Y. B. Lim, 2009 Spring Conference (Korean Inst. Electr. Eng., Korea, 2009) p. 172.
5 C. S. Choi and S. Y. Hahn, 2008 Fall Conference (Korean Inst. Electr. Eng., Korea, 2008) p. 301.
6 S. J. Ham, S. Y. Hahn, and C. S. Koh, Trans. KIEE., 56, 1397 (2007).