The Electrical Properties of Post-Annealing in Neutron-Irradiated 4H-SiC MOSFETs
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Lee, Taeseop
(Department of Electronic Materials Engineering, Kwangwoon University)
An, Jae-In (Department of Electronic Materials Engineering, Kwangwoon University) Kim, So-Mang (Department of Electronic Materials Engineering, Kwangwoon University) Park, Sung-Joon (Department of Electronic Materials Engineering, Kwangwoon University) Cho, Seulki (Department of Electronic Materials Engineering, Kwangwoon University) Choo, Kee-Nam (Korea Atomic Energy Research Institute) Cho, Man-Soon (Korea Atomic Energy Research Institute) Koo, Sang-Mo (Department of Electronic Materials Engineering, Kwangwoon University) |
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