1 |
J. M. Shieh, Y. F. Lai, W. X. Ni, H. C. Kuo, C. Y. Fang, J. Y. Huang, and C. L. Pan, Appl. Phys. Lett., 90, 051105 (2007). [DOI: https://doi.org/10.1063/1.2450653]
DOI
|
2 |
H. S. Bae, M. H. Yoon, J. H. Kim, and S. Im, Appl. Phys. Lett., 83, 5313 (2003). [DOI: http://dx.doi.org/10.1063/1.1633676]
DOI
|
3 |
E. Chen and S. Y. Chou, Appl. Phys. Lett., 70, 753 (1997). [DOI: http://doi.org/10.1063/1.118270]
DOI
|
4 |
O. M. Nayfeh, S. Rao, A. Smith, J. Therrien, and M. H. Nayfeh, IEEE Photonics Technol. Lett., 16, 1927 (2004). [DOI: https://doi.org/10.1109/LPT.2004.831271]
DOI
|
5 |
J. M. Choi and S. Im, Appl. Surf. Sci., 244, 435 (2005). [DOI: https://doi.org/10.1016/j.apsusc.2004.09.152]
DOI
|
6 |
M. Zyaei, H. R. Saghai, K. Abbasian, and A. Rostami, Opt. Commun., 281, 3739 (2008). [DOI: https://doi.org/10.1016/j.optcom.2008.03.036]
DOI
|
7 |
D. Mutschau, K. Holzner, and E. Obermeier, Sens. Actuators, B, 36, 320 (1996). [DOI: https://doi.org/10.1016/S0925-4005(97)80089-5]
DOI
|
8 |
J. Bullock, D. Yan, A. Cuevas, Y. Wan, and C. Samundsett, Energy Procedia, 77, 446 (2015). [DOI: https://doi.org/10.1016/j.egypro.2015.07.063]
DOI
|
9 |
C. Zhao, Z. Liang, M. Su, P. Liu, W. Mai, and W. Xie, ACS Appl. Mater. Interfaces, 7, 25981 (2015). [DOI: https://doi.org/10.1021/acsami.5b09492]
DOI
|
10 |
J. Zhou, N. S. Xu, S. Z. Deng, J. Chen, J. C. She, and Z. L. Wang, Adv. Mater., 15, 1835 (2003). [DOI: https://doi.org/10.1002/adma. 200305528]
DOI
|
11 |
W. H. Park, D. K. Ban, H. Kim, H. S. Kim, M. Patel, J. H. Yoo, and J. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 29, 445 (2016). [DOI: http://dx.doi.org/10.4313/JKEM.2016.29.7.445]
|
12 |
W. H. Park and J. D. Kim, J. Korean Inst. Electr. Electron. Mater. Eng., 29, 720 (2016). [DOI: http://dx.doi.org/10.4313/JKEM.2016.29.11.720]
|
13 |
W. S. Choi, Trans. Electr. Electron. Mater., 12, 267 (2011). [DOI: https://doi.org/10.4313/TEEM.2011.12.4.267]
DOI
|