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http://dx.doi.org/10.4313/JKEM.2017.30.2.96

Transient Current Limiting Characteristics of Flux-Lock Type SFCL Using Double Quench  

Choi, Sang-Jae (School of Electrical Engineering, Soongsil University)
Lim, Sung-Hun (School of Electrical Engineering, Soongsil University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.30, no.2, 2017 , pp. 96-100 More about this Journal
Abstract
In this paper, the flux-lock type superconducting fault current limiter (SFCL) using double quench was suggested and its transient current limiting characteristics were analyzed. The suggested flux-lock type SFCL using double quench consists of two magnetically coupled windings and two $high-T_{c}$ superconducting (HTSC) elements connected in series with each winding. To analyze the transient current limiting characteristics of the flux-lock type SFCL using double quench, the short-circuit tests according to the fault angles, which affect the transient component of the fault current right after the fault occurs, were executed. From the comparative analysis for the short-circuit tests at both $0^{\circ}$ and $90^{\circ}$ fault angles, the useful transient current limiting operations of the suggested flux-lock type SFCL through the double or the single quench occurrence were confirmed.
Keywords
Flux-lock type SFCL (superconducting fault current limiter); Double quench; Transient current limiting characteristics;
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