A Study of Middle Infrared Transparent Properties of ZnS Ceramics by the Change of Micro Structure |
Park, Chang-Sun
(Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology)
Yeo, Seo-Yeong (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Kwon, Tae-Hyeong (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Park, Woon-ik (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Yun, Ji-Sun (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Jeong, Young-Hun (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Hong, Youn-Woo (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Cho, Jeong-Ho (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) Paik, Jong-Hoo (Electronic Materials & Component Center, Korea Institute of Ceramic Engineering & Technology) |
1 | Y. Li and Y. Wu, J. Am. Ceram. Soc., 98, 2972 (2015). [DOI: https://doi.org/10.1111/jace.13781] DOI |
2 | W. L. Davidson, Phys. Rev., 74, 116 (1948). |
3 | J. Huang, Y. Yang, S. Xue, B. Yang, S. Liu, and J. Shen, Appl. Phys. Lett., 70, 2335 (1997). [DOI: https://doi.org/10.1063/1.118866] DOI |
4 | S. Okur, N. Uzar, N. Tekguzel, A. Erol, and M. C. Arikan, Physica E, 44, 1103 (2012). [DOI: https://doi.org/10.1016/j.physe.2010.08.015] DOI |
5 | M. Bredol and J. Merikhi, J. Mater. Sci., 33, 471 (1998). [DOI: https://doi.org/10.1023/A:1004396519134] DOI |
6 | P. Calandra, M. Goffredi, and V. T. Liveri, Colloids Surf. A, 160, 9 (1999). [DOI: https://doi.org/10.1016/S0927-7757(99)00256-3] DOI |
7 | P. Biswas, R. S. Kumar, P. Ramavath, V. Mahendar, G.V.N. Rao, U. S. Hareesh, and R. Johnson, J. Alloys Compd., 496, 273 (2010). [DOI: https://doi.org/10.1016/j.jallcom.2010.01.120] DOI |
8 | C. Chlique, G. Delaizir, O. Merdrignac-Conance, C. Roucau, M. Dolle, P. Rozier, V. Bouquet, and X. H. Zhang, Opt. Mater., 33, 706 (2011). [DOI: https://doi.org/10.1016/j.optmat.2010.10.008] DOI |
9 | Y. D. Kim, K. Sonezaki, H. Maeda, and A. Kato, J. Mater. Sci., 32, 5101 (1997). [DOI: https://doi.org/10.1023/A:1018613316157] DOI |
10 | Z. Shizen, M. A. Hongli, R. Jean, M. C. Odile, A. Jean-Luc, L. Jacques, and Z. Xianghua, Optoelectron. Adv. Mater. Rapid Commun., 1, 667 (2007). [DOI: https://hal.archives-ouvertes.fr/hal-01465328] |
11 | J. S. McCloy and B. G. Potter, Opt. Mater. Express, 3, 1273 (2013). [DOI: https://doi.org/10.1364/OME.3.001273] DOI |
12 | C. I. Kim, Y. B. Kim, S. Y. Yeo, Y. W. Hong, J. S. Yun, W. I. Park, Y. H. Jeong, J. H. Cho, and J. H. Paik, J. Korean Inst. Electr. Electron. Mater. Eng., 30, 349 (2017). [DOI: https://doi.org/10.4313/JKEM.2017.30.6.349] |
13 | T. Ueno, M. Hasegawa, M. Yoshimura, H. Okada, T. Nishioka, K. Teraoka, A. Fujii, and S. Nakayama, SEI Tech. Rev., 69, 48 (2009). |
14 | X. Fang, T. Zhai, U. K. Gautam, L. Li, L. Wu, Y. Bando, and D. Golberg, Prog. Mater Sci., 56, 175 (2011). [DOI: https://doi.org/10.1016/j.pmatsci.2010.10.001] DOI |
15 | B. H. Hwang, H. B. Xu, S. J. Park, S. E. Choi, S. Nahm, Y. W. Hong, J. H. Paik, T, H. Shin, and J. S. Kang, Ceram. Int., 42, 11700 (2016). [DOI: https://doi.org/10.1016/j.ceramint.2016.04.088] DOI |