A Study on Electricity Properties of Polyethylene Terephthalate Film due to Thermally Degradation

In this study, the thermal degradation properties of polyethylene terephthalate film has been examined by the capacitance, Tan ${\delta}$, thermography, FTIR, and SEM results at temperatures of $90{\sim}170^{\circ}C$ and frequencies of 0.3~3,000 kHz. It was found that the capacitance decreased with increasing thermal imaging temperature, probably caused by weakening of chemical bond with increasing temperature. Tan ${\delta}$ decreased upon increasing temperature from $90^{\circ}C$ to $170^{\circ}C$, probably due to the molecular motion of COOH radical or OH radical. The FT-IR measurement reveals that no structural change of the material occurs upon thermal radiation. The SEM measurement shows that the material is stabilized by thermal decomposition with increasing temperature; however, excessive thermal degradation obstructs the stabilization of the material.

열 열화에 의한 폴리에틸렌 테레프탈레이트 필름의 전기 특성에 관한 연구