1 |
S. M. Byeon and J. H. Yoo, J. Electroceram., 32, s10832-014-9948-7 (2014).
|
2 |
Y. H. Jeong, S. M. Byeon, J. H. Yoo, and J. I. Hong, Ferroelectr. Lett., 39, 63-69 (2012). [DOI: http://dx.doi.org/10.1080/07315171.2012.707054]
DOI
|
3 |
J. Hong, Y. Jeong, and J. Yoo, J. Korean Inst. Electr. Electron. Mater. Eng., 13, 502 (2000).
|
4 |
S. Cho, H. Shin J. Kim, Y Lee, and K. Kim, J. KIIEIE, 22, 69 (2008).
|
5 |
S. Sudaram, P. Senthikumar, and N. Manoharan, J. Eng. Appl. Sci., 2, 1581 (2007).
|
6 |
B. Kim and Y. Kim, J. KSNT, 12, 4 (1992).
|