Tailoring Low-field Strain Properties of [0.97Bi1/2(Na0.78K0.22)1/2TiO3-0.03LaFeO3]-Bi1/2(Na0.82K0.18)1/2TiO3 Lead-Free Relaxor/Ferroelectric Composites |
Hong, Chang-Hyo
(School of Materials Science and Engineering, Ulsan National Institute of Science and Technology)
Kang, Jin-Kyu (School of Materials Science and Engineering, University of Ulsan) Jo, Wook (School of Materials Science and Engineering, Ulsan National Institute of Science and Technology) Lee, Jae-Shin (School of Materials Science and Engineering, University of Ulsan) |
1 | W. Jo, R. Dittmer, M. Acosta, J. Zang, C. Groh, E. Sapper, K. Wang, and J. Rodel, J. Electroceram., 29, 71 (2012). [DOI: http://dx.doi.org/10.1007/s10832-012-9742-3] DOI |
2 | S. H. Shin and J. H. Yoo, Trans. Electr. Electron. Mater., 15, 226 (2014). [DOI: http://dx.doi.org/10.4313/TEEM.2014.15.4.226] DOI |
3 | J. Rodel, K. G. Webber, R. Dittmer, W. Jo, M. Kimura, and D. Damjanovic, J. Eur. Ceram. Soc., 35, 1659 (2015). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2014.12.013] DOI |
4 | C. H. Hong, H. S. Han, J. S. Lee, K. Wang, F. Z. Yao, J. F. Li, J. H. Gwon, N. V. Quyet, J. K. Jung, and W. Jo, J. Sensor Sci. & Tech., 24, 228 (2015). [DOI: http://dx.doi.org/10.5369/JSST.2015.24.4.228] DOI |
5 | C. H. Hong, H. P. Kim, B. Y. Choi, H. S. Han, J. S. Son, C. W. Ahn, and W. Jo, J. Materiomics, 2, 1 (2016). [DOI: http://dx.doi.org/10.1016/j.jmat.2015.12.002] DOI |
6 | Y. Saito, H. Takao, T. Tani, T. Nonoyama, K. Takatori, T. Homma, T. Nagaya, and M. Nakamura, Nature, 432, 84 (2004). [DOI: http://dx.doi.org/10.1038/nature03028] DOI |
7 | T. Takenaka and H. Nagata, J. Eur. Ceram. Soc., 25, 2693 (2005). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2005.03.125] DOI |
8 | T. R. Shrout and S. J. Zhang, J. Electroceram., 19, 113 (2007). [DOI: http://dx.doi.org/10.1007/s10832-007-9047-0] DOI |
9 | S. Zhang, R. Xia, and T. R. Shrout, J. Electroceram., 19, 251 (2007). [DOI: http://dx.doi.org/10.1007/s10832-007-9056-z] DOI |
10 | W. Liu and X. Ren, Phys. Rev. Lett., 103, 257602 (2009). [DOI: http://dx.doi.org/10.1103/PhysRevLett.103.257602] DOI |
11 | J. Rodel, W. Jo, K.T.P. Seifert, E. M. Anton, T. Granzow, and D. Damjanovic, J. Am. Ceram. Soc., 92, 1153 (2009). [DOI: http://dx.doi.org/10.1111/j.1551-2916.2009.03061.x] DOI |
12 | K. Wang and J. F. Li. J. Adv. Ceram., 1, 24 (2012). [DOI: http://dx.doi.org/10.1007/s40145-012-0003-3] DOI |
13 | J. F. Li, K. Wang, F. Y. Zhu, L. Q. Cheng, and F. Z. Yao, J. Am. Ceram. Soc., 96, 3677 (2013). [DOI: http://dx.doi.org/10.1111/jace.12715] DOI |
14 | B. Malic, J. Koruza, J. Hrescak, J. Bernard, K. Wang, J. G. Fisher, and A. Bencan, Materials, 8, 8117 (2015). [DOI: http://dx.doi.org/10.3390/ma8125449] DOI |
15 | S. G. Bae, H. G. Shin, K. H. Chung, J. H. Yoo, and I. H. Im, Trans. Electr. Electron. Mater., 16, 179 (2015). [DOI: http://dx.doi.org/10.4313/TEEM.2015.16.4.179] DOI |
16 | S. T. Zhang, A. B. Kounga, E. Aulbach, H. Ehrenberg, and J. Roodel, Appl. Phys. Lett., 91, 112906 (2007). [DOI: http://dx.doi.org/10.1063/1.2783200] DOI |
17 | A. Hussain, C. W. Ahn, J. S. Lee, A. Ullah, and I. W. Kim, Sens. Actuat. A, 158, 84 (2010). [DOI: http://dx.doi.org/10.1016/j.sna.2009.12.027] DOI |
18 | K. N. Pham, A. Hussain, C. W. Ahn, W. Kim, S. J. Jeong, and J. S. Lee, Mater. Lett., 64, 2219 (2010). [DOI: http://dx.doi.org/10.1016/j.matlet.2010.07.048] DOI |
19 | V. Q. Nguyen, H. S. Han, K. J. Kim, D. D. Dang, K. K. Ahn, and J. S. Lee, J. Alloys Compd., 511, 237 (2012). [DOI: http://dx.doi.org/10.1016/j.jallcom.2011.09.043] DOI |
20 | H. S. Han, W. Jo, J. K. Kang, C. W. Ahn, I. W. Kim, K. K. Ahn, and J. S. Lee, J. Appl. Phys., 113, 154102 (2013). [DOI: http://dx.doi.org/10.1063/1.4801893] DOI |
21 | D. S. Lee, D. H. Lim, M. S. Kim, K. H. Kim, and S. J. Jeong, Appl. Phys. Lett., 99, 062906 (2011). [DOI: http://dx.doi.org/10.1063/1.3621878] DOI |
22 | D. S. Lee, S. J. Jeong, M. S. Kim, and J. H. Koh, J. Appl. Phys., 112, 124109 (2012). [DOI: http://dx.doi.org/10.1063/1.4770372] DOI |
23 | C. Groh, D. J. Franzbach, W. Jo, K. G. Webber, J. Kling, L. A. Schmitt, H. J. Kleebe, S. J. Jeong, J. S. Lee, and J. Rodel, Adv. Funct. Mater., 24, 356 (2014). [DOI: http://dx.doi.org/10.1002/adfm.201302102] DOI |
24 | C. Groh, W. Jo, and J. Rodel, J. Am. Ceram. Soc., 97, 1465 (2014). [DOI: http://dx.doi.org/10.1111/jace.12783] DOI |
25 | C. Groh, W. Jo, and J. Rodel, J. Appl. Phys., 115, 234107 (2014). [DOI: http://dx.doi.org/10.1063/1.4876680] DOI |
26 | H. Zhang, C. Groh, Q. Zhang, W. Jo, K. G. Webber, and J. Rodel, Adv. Electr. Mater., 1, 1500018 (2015). DOI |
27 | W. Jo and J. Rodel, Appl. Phys. Lett., 99, 042901 (2011). [DOI: http://dx.doi.org/10.1063/1.3615675] DOI |