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http://dx.doi.org/10.4313/JKEM.2015.28.8.539

Development of Diagnostic Device for Internal Degradation in Distribution Line Using NDT Mathod  

Hyun, Deuk-Chang (Department of Ubiquitious IT, Far East University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.28, no.8, 2015 , pp. 539-543 More about this Journal
Abstract
At present, the development of a detection device in order to prevent accidents due to wire deterioration in the distribution lines is required. Distribution line is not possible to check the internal state in a normal way because it is covered with the coating. Accordingly, various eddy current techniques that is the non-destructive test (NDT) techniques have been applied to solve this problem. In this paper, we have seen examining the characteristic change of the eddy current sensor according to the simplified shape of the sensor in order to solve the problems for the simplified shape that is generated when the simulation for the shape of the eddy current sensor.
Keywords
Internal degradation; Distribution; NDT; Eddy current;
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