Study on Optical Control Layer for Micro Pattern Shape Change Using Thermal Reflow Process |
Seong, Min-Ho
(Department of Advanced Material, Korea Polytechnic)
Cha, Ji-Min (Department of Advanced Material, Korea Polytechnic) Moon, Seong-Cheol (Department of Advanced Material, Korea Polytechnic) Ryung, Si-Hong (Department of Advanced Material, Korea Polytechnic) Lee, Seong Eui (Department of Advanced Material, Korea Polytechnic) |
1 | M. K. Wei, I. L. Su, and M. C. Jung, Sci. Eng., 7, 81, (2004). |
2 | T. W. Choi and S. C. Yoo, J. Korean Inst. Electr. Electron. Mater. Eng., 15, 10 (2001). |
3 | J. C. Tsai and Y. S. Hsu, J. IEEE, 47, 10 (2011). |
4 | S. K. Hwang and S. H. Baek, Sci. Eng., 20, 81 (2009). |
5 | M. H. Lu and J. C. Strurm, J. Appl. Phys., 91, 595 (2002). DOI |
6 | P. Nussbaum, R. Volkel, H. P. Herzig, M. Eisner, and S. Haselbeck, Pure Appl. Opt., 6, 617 (1997). DOI |
7 | S. R. Cho, J. Kim, K. S, Oh, S. K. Yang, J. M. Baek, D. H, Jang, T. I. Kim, and H. Jeon, J. IEEE, 14, 378 (2002). |
8 | M. H. Lu and J. C. Strurm, Appl. Phys. Lett., 78, 1927 (2001). DOI |
9 | J. C. Tsai, K. R. Chang, and H. Yang, in Proc. 10th Anniversary Int. Conf. European Society for Precision Engineering and Nanotechnology (Zurich, Switzerland, 2008). |
10 | C. S. Lee, C. H. Han, Sensor. Actuat., A, 88, 87 (2001). DOI |
11 | R. Danzebrink and M. A. Aegerter, Thin Solid Films, 392, 223 (2001). DOI |
12 | T. Shiga, H. Fujikawa, and Y. Taga, J. Appl. Phys., 93, 19 (2003). DOI |
13 | J. K. Lim, Ph. D. Thesis, p.18-21, Kyungpook National University, Daegu (2011). |
14 | T. H. Kim, S. H. Park, H. K. Oh, and Y. J. Shin, Optics & Laser Technology, 39, 1437 (2007). DOI |
15 | A. Y. Smuk and N. M. Lawandy, J. Appl. Phys., 87, 4026 (2000). DOI |