Browse > Article
http://dx.doi.org/10.4313/JKEM.2015.28.3.160

Dielectric and Piezoelectric Properties of Low Temperature Sintering PMW-PNN-PZT Substituted with CeMnO3  

Kim, Yong-Jin (Department of Electrical Engineering, Semyung University)
Yoo, Ju-Hyun (Department of Electrical Engineering, Semyung University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.28, no.3, 2015 , pp. 160-164 More about this Journal
Abstract
In this study, $(1-x)Pb(Mg_{1/2}W_{1/2})_{0.03}(Ni_{1/3}Nb_{2/3})_{0.09}(Zr_{0.5}Ti_{0.5})_{0.88}O_3+xCeMnO_3$ (x= 0~0.02) ceramics were prepared by Columbite precursor method. The phase structure, ferroelectric and piezoelectric properties were systematically investigated. It was found that PMW-PNN-PZT possessed superior electrical properties due to its composition close to the MPB (morphotropic phase boundary). Coercive electric field of 10.05 [kV/cm] and density of 7.88 [$g/cm^3$] were obtained when the substitution amount of $CeMnO_3$ is x=0.02. In contrast, specimens with x=0.01 showed the mechanical quality factor($Q_m$) of 1,091 and the electromechanical coupling factor($k_p$) of 0.613.
Keywords
PMW-PNN-PZT; $CeMnO_3$ substitution; Piezoelectric properties; Low temperature sintering;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Y. H. Jeong, K. J. Yoo, and J. H. Yoo, J. Electroceram, 23, 387 (2009).   DOI
2 J. Y. Ha, J. W. Choi, C. Y. Kang, D. J. Choi, H. J. Kim, and S. J. Yoon, Mater. Chem. Phys., 90, 396 (2005).   DOI
3 K. H. Yoon, K. S. Kim, and B. S. Choi, J. Korean Inst. Electr. Electron. Mater. Eng., 14, 20 (2001).
4 K. S. Lee, I. H. Lee, J. H. Yoo, and S. L. Ryu, J. Korean Inst. Electr. Electron. Mater. Eng., 20, 1034 (2007).
5 Y. K. Oh, J. H. Yoo, S. B. Mah, and Y. H. Jeong, J. Korean Inst. Electr. Electron. Mater. Eng., 24, 194 (2011).
6 J. S. Kim, K. H. Yoon, B. H. Choi, J. O. Park, J. M. Lee, Journal of the Korean Ceramic Society, 27, 187 (1990).
7 D. H. Kim, K. J. Kim, and J. H. Yoo, Proc. of Autumn Conference, J. Korean Inst. Electr. Electron. Mater. Eng., 20, 255 (2007).