1 |
T. Alzanki, K. M. Kandil, N. Bennett, B. J. Sealy, M. R. Alenezi, A. Almeshal, M. Jafar, and A. Ghoneim, SOJ Mat. Sci. Eng., 2, 1 (2014).
|
2 |
N. S. Benett, N. E. B. Cowern, A. J. Smith, R. M. Gwilliam, B, J. Sealy, L. O'Reilly, P. J. McNally, G. Cooke, and H. Kheyrandish, Appl. Phys. Lett., 89, 182122 (2006). [DOI: http://dx.doi.org/10.1063/1.2382741]
DOI
|
3 |
R. Low, B. J. Sealy, and R. Gwilliam, J. Appl. Phys., 95, 5471 (2004). [DOI: http://dx.doi.org/10.1063/1.1702096]
DOI
|
4 |
J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
|
5 |
J. F. Ziegler, SRIM 2013 Manual, http://www.srim.org/.
|
6 |
W. Moller and W. Eckstein, Nucl. Insrum. Methods B, 2, 814 (1984). [DOI: http://dx.doi.org/10.1016/0168-583X(84)90321-5]
DOI
|
7 |
W. Eckstein, Computer Simulation of Ion-Solid Interactions (Springer, Berlin 1991). [DOI: http://dx.doi.org/10.1007/978-3-642-73513-4]
DOI
|
8 |
H. Ryssel, J. Lorenz, and W. Kreuger, Nucl. Insrum. Methods, B19, 45, (1987). [DOI: http://dx.doi.org/10.1016/S0168-583X(87)80012-5]
DOI
|
9 |
User's Guide, ICECREM Manual (1996).
|
10 |
C. Park, K. M. Klein, and A.L.F. Tasch, Solid State Electonics, 33, 645 (1990). [DOI: http://dx.doi.org/10.1016/0038-1101(90)90176-F]
DOI
|
11 |
C. Park, K. M. Klein, and A.L.F. Tasch, IEEE Trans. Electron Dev., 39, 1614 (1992). [DOI: http://dx.doi.org/10.1109/16.141226]
DOI
|