Effect of Uderpass Structure on Quality Factor and Breakdown Voltage in RF Inductor
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Shin, Jong-Kwan
(Department of Electronics Engineering, Chungnam National University)
Kwon, Sung-Kyu (Department of Electronics Engineering, Chungnam National University) Jang, Sung-Yong (Department of Electronics Engineering, Chungnam National University) Jung, Jin-Woong (Department of Electronics Engineering, Chungnam National University) Yu, Jae-Nam (Department of Electronics Engineering, Chungnam National University) Oh, Sun-Ho (Department of Electronics Engineering, Chungnam National University) Kim, Choul-Young (Department of Electronics Engineering, Chungnam National University) Lee, Ga-Won (Department of Electronics Engineering, Chungnam National University) Lee, Hi-Deok (Department of Electronics Engineering, Chungnam National University) |
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