1 |
G. S. Lee, Master Thesis, p.1-10, Busan University, Busan (2006).
|
2 |
P. L. Dowell, Proc. IEEE, 113 (1966).
|
3 |
C. C. Cheng, C. V. Dodd, and W. E. Deeds, Int. J. Nondestruct. Test., 3, 109 (1971).
|
4 |
S. D. Kim and J. M. Shim, J. of Korea Sensor Society, 6, 87 (1997).
|
5 |
S. Leonard and D. L. Atheron, IEEE Trans. on Mag., 32, 1905 (1996).
DOI
ScienceOn
|
6 |
S. J. Norton and J. R. Bowler, J. Appl. Phys., 73, 501 (1993).
DOI
|
7 |
S. D. Kim J. of Korea Institute of Illuminating and Electrical Installation Eng., 13, 77 (1999).
|
8 |
W. H. Hayt (Engineering Electromagnetics, McGraw-Hill, 1981)
|
9 |
Y. J. Wang, Proc. Natl. Sci. Counc. ROC, 23, 419 (1999).
|
10 |
Eddy Current Characterization of Materials and Structures (ASME Special Technical Publication, American Society for Testing and Materials, 1981)
|