Browse > Article
http://dx.doi.org/10.4313/JKEM.2012.25.7.531

Organic Semiconducting Thin Films Fabricated by Using a Pre-metered Coating Method for Organic Thin Film Transistors  

Cho, Chan-Youn (Department of Electrophysics, Kwangwoon University)
Jeon, Hong-Goo (Department of Electrophysics, Kwangwoon University)
Choi, Jin-Sung (Department of Electrophysics, Kwangwoon University)
Kim, Yun-Ki (Department of Electrophysics, Kwangwoon University)
Lim, Jong-Sun (Korea Research Institute of Chemical Technology Advanced Materials Division)
Jung, J. (Korea Research Institute of Chemical Technology Advanced Materials Division)
Cho, Song-Yun (Korea Research Institute of Chemical Technology Advanced Materials Division)
Lee, Chang-Jin (Korea Research Institute of Chemical Technology Advanced Materials Division)
Park, Byoung-Choo (Department of Electrophysics, Kwangwoon University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.25, no.7, 2012 , pp. 531-536 More about this Journal
Abstract
We herein present results of flat and uniform polymer-blended small molecular semiconductor thin films. Which were produced for organic thin film transistors (OTFTs), using a simple pre-metered horizontal dipping process. The organic semiconducting thin films were composed of 6,13-bis(triisopropylsilylethynyl)-pentacene (TIPS-PEN) composite blended with a polymer binder of poly(${\alpha}$-methylstyrene) (PaMS). We show that the pre-metered horizontal-dip-coating(H-dip-coating) process allowed the critical control of the thickness of the blended TIPS-PEN:PaMs thin film. The fabricated OTFTs using the TIPS-PEN:PaMs films exhibited maximum field-effect mobility of $0.22\;cm^2\;V^{-1}\;s^{-1}$. These results demonstrated that H-dip-coated TIPS-PEN:PaMS films show considerable promise for the production of reliable, reproducible, and high-performance OTFTs.
Keywords
Organic thin film transistor; Solution process; Pre-metered solution coating;
Citations & Related Records
연도 인용수 순위
  • Reference
1 J. Locklin, K. Shinbo, K. Onishi, F. Kaneko, Z. Bao, and R. C. Advincula, Chem. Mater., 15, 1404 (2003).   DOI
2 A. Tracz, J. K. Jeszka, M. D. Watson, W. Pisula, K. Muellen, and T. Pakula, J. Am. Chem. Soc., 125, 1682 (2003).   DOI
3 W. Pisula, A. Menon, M. Stepputat, I. Lieberwirth, U. Kolb, A. Tracz, H. Sirringhaus, T. Pakula, and K. Muellen, Adv. Mater., 17, 684 (2005).   DOI
4 K. C. Dickey, J. E. Anthony, and Y. Loo, Adv. Mater., 18, 1721 (2006).   DOI
5 T. D. Anthopoulos, F. B. Kooistra, H. J. Wondergem, D. Kronholm, J. C. Hummelen, and D. M. de Leeuw, Adv. Mater., 18, 1679 (2006).   DOI
6 C. Liu and A. J. Bard, Chem. Mater., 12, 2353 (2000).   DOI
7 T. Ohe, M. Kuribayashi, R. Yasuda, A. Tsuboi, K. Nomoto, K. Satori, M. Itabashi, and J. Kasahara, Appl. Phys. Lett., 93, 053303 (2008).   DOI
8 T. Ohe, M. Kuribayashi, A. Tsuboi, K. Satori, M. Itabashi, and K. Nomoto, Appl. Phys. Express, 2, 121502 (2009).   DOI
9 L. D. Landau and V. G. Levich, Acta Physicochim. URSS, 17, 42 (1942).
10 K. Kudo, M. Yamashina, and T. Moriizumi, Jpn. J. Appl. Phys., 23, 130 (1984).   DOI
11 A. Tsumura, H. Koezuka, and T. Ando, Appl. Phys. Lett., 49, 1210 (1986).   DOI
12 A. Dodabalapor, Z. Bao, A. Makhija, J. G. Laquindanumm, V. R. Raju, Y. Feng, H. E. Katz, and J. Rogers, Appl. Phys. Lett., 73, 142 (1998).   DOI   ScienceOn
13 M. Lee, K. Bae, S. Kim, S. Lim, and S. Nam, Polymer, 33, 397 (2009).
14 A. P. Kulkarni, X. Kong, and S. A. Jenekhe, Adv. Func. Mater., 16, 1057 (2006).   DOI
15 C. Kim, A. Facchetti, and T. J. Marks, J. Am. Chem. Soc., 131, 9122 (2009).   DOI
16 C. Kim, A. Facchetti, and T. J. Marks, Adv. Mater., 19, 2561 (2007).   DOI
17 F. S. Wilkinson, R. F. Norwood, J. M. McLellan, L. R. Lawson, and D. L. Patrick, J. Am. Chem. Soc., 128, 16468 (2006).   DOI
18 F. Ebisawa, T. Kurokawa, and S. Nara, J. Appl. Phys., 54, 3255 (1983).   DOI
19 B. Park and M. Y. Han, Opt. Express, 17, 13830 (2009).   DOI
20 B. Park and M. Y. Han, Opt. Express, 17, 21362 (2009).   DOI