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http://dx.doi.org/10.4313/JKEM.2012.25.7.516

Characteristics Analysis of Total Internal Reflection-based Dielectric Multi-layer Sensor Using Plasmonics Phenomena  

Kim, Hong-Seung (Department of Electrical and Electronics Engineering, Chung-Ang University)
Lee, Tae-Kyeong (Department of Electrical and Electronics Engineering, Chung-Ang University)
Kim, Doo-Gun (Korea Photonics Technology Institute, Photonics Fusion System Research Center)
Jung, You-Ra (Korea Photonics Technology Institute, Photonics Fusion System Research Center)
Oh, Geum-Yoon (Department of Electrical and Electronics Engineering, Chung-Ang University)
Lee, Byeong-Hyeon (Department of Electrical and Electronics Engineering, Chung-Ang University)
Ki, Hyun-Chul (Korea Photonics Technology Institute, Photonics Fusion System Research Center)
Choi, Young-Wan (Department of Electrical and Electronics Engineering, Chung-Ang University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.25, no.7, 2012 , pp. 516-520 More about this Journal
Abstract
In this paper, we have theoretically analyzed and designed a dielectric multi-layer sensor with a SPR (surface plasmon resonance) using analytical calculation and FDTD (finite difference time-domain) methods. The proposed structure is composed of periodic layer and thin metal film. It has many advantages. One of that is a high sensitivity of the SPR. Another is a high Q-factor of the characteristics in the PhC (photonic crystals) micro-cavity structure. The incident light has double resonance characteristics, because the filtered light by PhC structure, dielectric multi-layer, is met the thin metal film for SPR effect. We have also observed the change of resonance characteristics according to the variation of effective index on the metal film.
Keywords
Finite difference time-domain method; Multi-layer; Surface plasmon resonance; Plasmonics; Photonic crystals; $SiO_2$; $TiO_2$;
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