Browse > Article
http://dx.doi.org/10.4313/JKEM.2012.25.5.349

Photoluminescence Characteristics of ZnO Nanowires Grown on a-, c- and m-plane Oriented 4H-SiC Substrates  

Kim, Ik-Ju (Department of Electronic Materials Engineering, Kwangwoon University)
Yer, In-Hyung (Department of Electrical Engineering, Korea University)
Moon, Byung-Moo (Department of Electrical Engineering, Korea University)
Kang, Min-Seok (Department of Electronic Materials Engineering, Kwangwoon University)
Koo, Sang-Mo (Department of Electronic Materials Engineering, Kwangwoon University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.25, no.5, 2012 , pp. 349-352 More about this Journal
Abstract
ZnO thin films were deposited on a-, c- and m- plane oriented 4H-SiC substrates by pulsed laser deposition. ZnO nanowires were formed on substrates by tube furnace. Shape and density of the ZnO nanowires were investigated by field emission scanning electron microscope. Average surface roughness and root mean square surface roughness were measure by atomic force microscope. Optical properties were investigated by Photoluminescence measurement. Density of ZnO nanowires grown on a-, c- and m-plane oriented 4H-SiC substrates were 17.89 ${\mu}m^{-2}$, 9.98 ${\mu}m^{-2}$ and 2.61 ${\mu}m^{-2}$, respectively.
Keywords
4H-SiC; Substrate orientation; ZnO; Nanowire; Photoluminescence;
Citations & Related Records
연도 인용수 순위
  • Reference
1 D. T. Phan and G. S. Chung, Applied Surface Science, 257, 8 (2011).
2 C. Y. Liu, C. F. Chen, and J. P. Leu, J. Electrochem. Soc., 1, 16 (2009).
3 K. W. Kim, Y. W. Song, S. P. Chang, I. H. Kim, S. S. Kim, and S. Y. Lee, Thin Solid Films, 518, 1190 (2009).   DOI   ScienceOn
4 Z. D. Sha, X. M. Wua, and L. J. Zhuge, Physics Letters, A355, 215 (2007).
5 J. Wua, J. Hu, J. H. Zhao, X. Wang, X. Li, L. Fursin, and T. Burke, Solid-State Electronics, 52, 6 (2008).
6 J. H. Kim, D. H. Cho, W. Y. Lee, B. M. Moon, W. Bahng, S. C. Kim, N. K. Kim, and S. M. Koo, J. Alloys Comp., 489, 1 (2010).   DOI   ScienceOn
7 E. Karber, T. Raadik, T. Dedova, J. Krustok, A. Mere, V. Mikli, and M. Krunks, Nanoscale Research Letters, 6, 359 (2011).   DOI
8 T. Voss, C. Bekeny, J. Gutowski, R. Tena-Zaera, J. Elias, C. Levy-Clement, I. Mora-Sero, and J. Bisquert, J. Appl. Phys., 106, 054304 (2009).   DOI   ScienceOn