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http://dx.doi.org/10.4313/JKEM.2012.25.2.105

Trajectory of Resonant Displacement of Thickness Vibration Mode Piezoelectric Devices According to Diameter/Thickness Ratio  

Jeong, Yeong-Ho (Department of Electrical Engineering, Chungju National University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.25, no.2, 2012 , pp. 105-109 More about this Journal
Abstract
In this study, thickness vibration mode piezoelectric devices for AE sensor application were simulated using ATILA FEM program, and then fabricated. Trajectory resonant displacement and electro mechanical coupling factors of the piezoelectric devices were investigated. The simulation results showed that excellent displacement and electro mechanical coupling factor was obtained when the ratio of diameter/thickness($\Phi/T$) was 0.75. The piezoelectric device of $\Phi/T$=0.75 exhibited the optimum values of fr= 183 kHz, displacement= $4.44{\times}10^{-7}[m]$, $k_{33}$= 0.69, which were suitable for the application of AE sensor piezoelectric device.
Keywords
AE sensor; Thickness mode; Piezoelectric device;
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Times Cited By KSCI : 2  (Citation Analysis)
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