1 |
H. Ohsaki and Y. Kokubu, Thin Solid Films, 351, 1 (1999).
DOI
ScienceOn
|
2 |
M. Fhaland, P. Karlsson, and C. Charton, Thin Solid Films, 392, 334 (2001).
DOI
|
3 |
M. Bender, W. Seeling, C. Daube, H. Frankenberger, B. Ocker, and J. Stollenwerk, Thin Solid Films, 326, 67(1998).
DOI
|
4 |
D. Kim, Trans. Electr. Electron. Mater., 10, 165 (2009).
과학기술학회마을
DOI
|
5 |
J. H. Lee, S. H. Lee, and C. K. Hwangbo, J. Korean Phys. Soc., 44, 750 (2004).
DOI
|
6 |
W. S. Oh, S. H. Lee, G. E. Jang, and S. W. Park, J. KIEEME, 23, 681 (2010).
과학기술학회마을
DOI
|