Phase Change Characteristics of Aux(Ge2Sb2Te5)1-x (x=0, 0.0110, 0.0323, 0.0625) Thin Film for PRAM |
Shin, Jae-Ho
(Department of Advanced Chemicals & Engineering, Chonnam National University)
Baek, Seung-Cheol (Department of Advanced Chemicals & Engineering, Chonnam National University) Kim, Byung-Cheul (Department of Electronic Engineering, Gyeongnam National University of Science and Technology) Lee, Hyun-Yong (School of Applied Chemical Engineering, Chonnam National University) |
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