Browse > Article
http://dx.doi.org/10.4313/JKEM.2011.24.2.141

Analysis on Current Limiting Characteristics of a Fault-lock Type SFCL Applied into a Simulated Power System  

Han, Tae-Hee (Department of Energy Resources Engineering, Jungwon University)
Lim, Sung-Hun (Department of Electrical Engineering, Soongsil University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.24, no.2, 2011 , pp. 141-146 More about this Journal
Abstract
When the current of the superconducting element exceeds its critical current by the fault occurrence, the quench of the high-$T_C$ superconducting fault current limiter (HTSC) comprising the flux-lock type superconducting fault current limiter (SFCL) occurs. Simultaneously, the magnetic flux in the iron core induces the voltage in each coil, which contributes to limit the fault current. In this paper, the fault current limiting characteristics of the flux-lock type SFCL as well as the load voltage sag suppressing characteristics according to the flux-lock type SFCL's winding direction were investigated. To confirm the fault current limiting and the voltage sag suppressing characteristics of the this SFCL, the short-circuit tests for the simulated power system with the flux-lock type SFCL were carried out. The flux-lock type SFCL designed with the additive polarity winding was shown to perform more effective fault current limiting and load voltage sag suppressing operations through the fast quench occurrence right after the fault occurs and the fast recovery operation after the fault removes than the flux-lock type SFCL designed with the subtractive polarity winding.
Keywords
Flux-lock type superconducting fault current limiter (SFCL); Fault current; Voltage sag suppressing operation; Magnetic flux;
Citations & Related Records
연도 인용수 순위
  • Reference
1 B. W. Lee, J. S. Kang, K. B. Park, I. S. OH, Superconductivity and Cryogenics, 5, 10 (2003).
2 G. W. Lee, Superconductivity and Cryogenics, 3, 8 (2001).
3 E. Thuries, V. D. Pham, Y. Laumond, U. Verhaege, A, Fevrier, M. Collet, and M. Bekhaled, IEEE Trans. On Power Del., 6, 801 (1991).   DOI
4 T. Matsumura, A. Kimura, H. Shimizu, Y. Yokomizu, and M. Goto, IEEE Trans. Appl. Supercond., 13, 2024 (2003).   DOI
5 T. Matsumura, T. Uchii, and Y. Yokomizu, IEEE Trans. Appl. Supercond., 7, 1001 (1997).   DOI
6 S. H. Lim and H. S. Choi, Physica C, 445, 1073 (2006).   DOI   ScienceOn
7 T. H. Han, H. S. Choi, S. H. Lim, N. Y. Lee, Physica C, 463, 1209 (2007).   DOI
8 S. H. Lim, H. G. Kang, H. S. Choi, S. R. Lee, B. S. Han, IEEE Trans. on Appl. Supercond., 13, 2056 (2003).   DOI