Browse > Article
http://dx.doi.org/10.4313/JKEM.2010.23.8.605

EEPROM Charge Sensors  

Lee, Dong-Kyu (College of Electrical and Computer Engineering, Chungbuk National University)
Jin, Hai-Feng (College of Electrical and Computer Engineering, Chungbuk National University)
Yang, Byung-Do (College of Electrical and Computer Engineering, Chungbuk National University)
Kim, Young-Suk (College of Electrical and Computer Engineering, Chungbuk National University)
Lee, Hyung-Gyoo (College of Electrical and Computer Engineering, Chungbuk National University)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.23, no.8, 2010 , pp. 605-610 More about this Journal
Abstract
The devices based on electrically erasable programmable read-only memory (EEPROM) structure are proposed for the detection of external electric charges. A large size charge contact window (CCW) extended from the floating gate is employed to immobilize external charges, and a control gate with stacked metal-insulator-metal (MIM) capacitor is adapted for a standard single polysilicon CMOS process. When positive voltage is applied to the capacitor of CCW of an n-channel EEPROM, the drain current increases due to the negative shift of its threshold voltage. Also when a pre-charged external capacitor is directly connected to the floating gate metal of CCW, the positive charges of the external capacitor make the drain current increase for n-channel, whereas the negative charges cause it to decrease. For an p-channel, however, the opposite behaviors are observed by the external voltage and charges. With the attachment of external charges to the CCW of EEPROM inverter, the characteristic inverter voltage behavior shifts from the reference curve dependent on external charge polarity. Therefore, we have demonstrated that the EEPROM inverter is capable of detecting external immobilized charges on the floating gate. and these devices are applicable to sensing the pH's or biomolecular reactions.
Keywords
EEPROM; Inverter; Extended floating gate; Charge sensor;
Citations & Related Records
연도 인용수 순위
  • Reference
1 L. Abbati, P. Placidi, A. Scorzoni, and M. Lanzoni, 2nd IEEE International Workshop on Advances in Sensors and Interfaces (IWASI 2007) (IEEE, Bari, Italy, 2007) p. 1.
2 K.-Y. Na and Y. S. Kim, IEEE Electron. Device Lett. 27, 291 (2006).   DOI
3 B. Chen, C. Tao, S. William, and S. Pandey, Proc. IEEE Int. Conf. on Electro/ Information Technology (EIT 2008) (IEEE, Ames, USA) p. 300.
4 Y. Cui, Q. Wei, H. Park, and C.M. Lieber, Science 293, 1289 (2001).   DOI   ScienceOn
5 E. Stern, J. F. Klemic, D. A. Routenberg, P. N. Wyrembak, D. B. Turner-Evans, A. D. Hamilton, D. A. LaVan, T. M. Fahmy, and S. A. Reed, Nature 445, 519 (2007).   DOI
6 Z. Cui, M. Choi, Y. Kim, H. Lee, K. Kim, and N. Kim, Electron. Lett. 45, 185 (2009).   DOI
7 M. Barbaro, A. Bonfigio, and L. Raffo, IEEE Trans. Elect. Dev. 53, 158 (2006).   DOI