Frequency Spectrum Analysis of Series Arc and Corona Discharges |
Kil, Gyung-Suk
(Division of Electrical and Electronics Engineering, Korea Maritime University)
Jung, Kwang-Seok (Division of Electrical and Electronics Engineering, Korea Maritime University) Park, Dae-Won (Division of Electrical and Electronics Engineering, Korea Maritime University) Kim, Sun-Jae (Division of Electrical and Electronics Engineering, Korea Maritime University) Han, Ju-Seop (Research Institute of Industrial Technology, Korea Maritime University) |
1 | I.-K. Kim, D.-W. Park, S.-Y. Choi, C.-Y. Park, H.-K. Kim, and G.-S. Kil, J. KIEEME 21, 182 (2008). |
2 | S. Tenbohlen, D. Uhde, and J. Poittevin, CIGRE Session 2000 (CIGRE, Paris, 2000) Paper 12-204. |
3 | P. Agoris, P. Cichecki, S. Meijer, E. Gulski, and J. J. Smit, Proc. 15th Int. Symp. High Volt. Eng. (ISH, Ljubljana, Slovenia, 2007) Paper T7-737. |
4 | T. Leibfried and K. Feser, IEEE Int. Symp. Electr. Insul. (IEEE, Montreal, 1996) p. 34. |
5 | A. Denat, IEEE Intern. Conf. Dielectr. Liquids(ICDL), (IEEE Coimbra, Portugal, 2005) p. 57. |
6 | R. Tobazeon, IEEE Trans. Dielectr. Electr. Insul. 1, 1132 (1994). DOI |
7 | L. A. Dissado, S. J. Dodd, J. V. Champion, P. I. Williams, and J. M. Alison, IEEE Trans. Dielectr. Electr. Insul. 4, 259 (1997). DOI |
8 | S.-J. Kim, K.-S. Jung, D.-W. Park, and G.-S. Kil, Proc. 2010 Spring Conf. KIEEME (Kor. Inst. Elec. Electr. Mater. Eng., Changwon, Korea, 2010) p. 24. |
9 | L. A. Dissado and J. C. Forthergill, Electrical Degradation and Breakdown in Polymers (Redwood Press, Wiltshire, UK, 1992) p. 242. |
10 | J. C. Fothergill, L. A. Dissado, and P. J. J. Sweeney, IEEE Trans. Dielectr. Electr. Insul. 1, 474 (1994). DOI |
11 | F. H. Kreuger, Partial Discharge Detection in High-Voltage Equipment (Butterworth & Co Ltd, London, 1989) p. 1. |
12 | Standards Coordinating Committee 10 (Terms and Definitions) Jane Radatz (Chair), The IEEE Standard Dictionary of Electrical and Electronics Terms (IEEE Publishing, 1996) IEEE Std 100-1996. |
13 | W.-J. Li and Y.-C. Li, Proc. 2005 4th Int. Conf. Mach. Learn. Cybern. 3, 1783 (2005). |