Analysis of Fin-Type SOHOS Flash Memory using Hafnium Oxide as Trapping Layer |
Park, Jeong-Gyu
(Department of Electronics Engineering, Chungnam National University)
Oh, Jae-Sub (Nano Patterning Process Team, National Nanofab Center) Yang, Seung-Dong (Department of Electronics Engineering, Chungnam National University) Jeong, Kwang-Seok (Department of Electronics Engineering, Chungnam National University) Kim, Yu-Mi (Department of Electronics Engineering, Chungnam National University) Yun, Ho-Jin (Department of Electronics Engineering, Chungnam National University) Han, In-Shik (Department of Electronics Engineering, Chungnam National University) Lee, Hi-Deok (Department of Electronics Engineering, Chungnam National University) Lee, Ga-Won (Department of Electronics Engineering, Chungnam National University) |
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