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http://dx.doi.org/10.4313/JKEM.2009.22.2.174

A Study on the Phase Noise Improvement of Oscillator using Dielectric-rod loaded Cavity Resonators with HIS End-plates  

Lee, Won-Hui (포항공과대학교 BK21 미래정보기술사업단)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.22, no.2, 2009 , pp. 174-177 More about this Journal
Abstract
In this paper, an oscillator using dielectric-rod loaded cavity resonators with HTS(High Temperature Superconductor) end-plates was presented. It was operated at X-band. A two port cavity resonator was incorporated into a basic feedback loop oscillator configuration. A rutile loaded cavity resonator with HTS thin film end-plates was used to provide the quality factor between $10^4$ and $10^6$. A parallel feedback oscillator was constructed with a dielectric loaded cavity resonator, an amplifier, and a directional coupler. At 300 K, the experimental results showed the phase noise of -108 dBc/Hz at a 100 kHz offset frequency. At 26 K, the results was -118.8 dBc/Hz at same offset frequency.
Keywords
Oscillator; HTS; Dielectric-rod loaded cavity; Quality factor; Phase noise;
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  • Reference
1 B. Cheng, 'Signal generator spectral purity considerations in RF communications testing', Microwave Journal, Vol. 10, No. 1, p. 22, 1999
2 C. Moore and B. Kopp, 'Phase and amplitude noise due to analog control components', Microwave Journal, Vol. 12, No. 1, p. 64, 1998
3 정동철, '고온초전도체의 마이크로파 통신소자 연구개발 현황', 전기전자재료, 16권, 11호, p. 11, 2003
4 G. Gonzalez, 'Microwave Transistor Amplifiers 2/E : Analysis and Design S/C', Prentice Hall, p. 98, 2006
5 A. Grebennikovi, 'RF and Microwave Transistor Oscillator Design', John wiley & Sons, p. 83, 2007
6 G. D. Vendelin, A. M. Pavio, and U. L. Rohde, 'Microwave Circuit Design using Linear and Nonlinear Techniques 2ND', John Wiley & Sons, p. 719, 2005
7 E. Ngoya, J. Rousset, and D. Argello, 'Rigorous RF and Microwave Oscillator Phase Noise Calculation by Envelope Transient Technique', IEEE MTT-S Digest, p. 91, 2000