Browse > Article
http://dx.doi.org/10.4313/JKEM.2008.21.5.440

The Electrical Properties of High Voltage Mutilayer Chip Capacitor with X7R by addition of Er2O3 and Glass Frit  

Yoon, Jung-Rag (삼화콘덴서공업(주) 연구소)
Kim, Min-Kee (삼화콘덴서공업(주) 연구소)
Chung, Tae-Seog (삼화콘덴서공업(주) 연구소)
Woo, Byoung-Chul (삼화콘덴서공업(주) 연구소)
Lee, Seog-Won (호서대학교 정보제어공학과)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.21, no.5, 2008 , pp. 440-446 More about this Journal
Abstract
To manufacture the MLCC with X7R for high voltage stability, $BaTiO_3-MgO-MnO_2-Y_2O_3$ with $(Ba_{0.4}Ca_{0.6})SiO_3$ glass frit was formulated. Based on this composition, the addition of $Er_2O_3$ showed that TCC(Temperature Coefficient Capacitance) at $85^{\circ}C$ was improved from 5 % to ${\sim}0\;%$, but the dielectric constant and IR (Insulation Resistance) were decreased. The glass frit improved the dielectric constant and IR, so the appropriate contents of $Er_2O_3$ and glass frit were 0.6 mol% and 1 wt%, respectively. It showed that the dielectric constant and RC constant were 2,550 and 2,000 (${\Omega}F$), respectively in the sintering condition at $1250^{\circ}C$ in PO2 $10^{-7}$ Mpa. The MLCC with $3.2{\times}1.6$ (mm) size and $1\;{\mu}F$ was also suited for X7R with the above composition.
Keywords
MLCC; X7R; Dielectric constant; Insulation resistance; Core-shell; TCC(Temperature coefficient capacitance);
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 문 환, 김민기, 전현표, 안재평, 윤중락, 정태석, '첨가물의 형태가 MLCC X7R 조성의 유전특성 및 미세구조에 미치는 영향', 한국세라믹학회논문지, 40권, 7호, p. 644, 2003
2 T. Tsurumi, H. Adachi, H. kakemoto, S. Wada, Y. Mizuno, H. Chazono, and H. Kishi, 'Dielectric properties of $BaTiO_3$-based ceramics under high electric field', Jpn. J. Appl. Phys., Vol. 41, Part 1, No. 11B, p. 6929, 2002   DOI
3 Electronic Industries Association, Specification, #RS198
4 H. Chazono and H. Kishi, 'DC‐electrical degradation of the BT‐based materials for multilayer ceramic capacitor with Ni internal electrode: Impedance analysis and micro- structure', Jpn. J. Appl. Phys., Vol. 40, p. 5624, 2001   DOI
5 이석원, 윤중락, 'X7R 적층칩 세라믹 캐패시터 조성의 희토류첨가에 따른 유전특성', 전기전자재료학회논문지, 16권, 12호, p. 1080, 2003
6 H. Kishi, N. Kohzu, J. Sugino, H. Ohsato, Y. Iguchi, and T. Okuda, 'The effect of rare- earth (La, Sm, Dy, Ho and Er) and Mg on the microstructure in $BaTiO_3$', J. Eur. Ceram. Soc., Vol. 19, p. 1043, 1999   DOI   ScienceOn
7 윤중락, 우병철, 이헌용, 이석원, '고용량 적층 세라믹 캐패시터에서 설계 및 제조공정에 따른 전기적 특성 평가', 전기전자재료학회논문지, 20권, 2호, p. 118, 2007   과학기술학회마을   DOI