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http://dx.doi.org/10.4313/JKEM.2008.21.3.213

The Improvement of Matching of Amplifier Input Transistor for Display Driver IC  

Kim, Hyeon-Cheol (삼성전자(주) S.LSI 사업부 기술개발실 DDI PA)
Roh, Yong-Han (성균관대학교 정보통신공학부)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.21, no.3, 2008 , pp. 213-216 More about this Journal
Abstract
The voltages for pixel electrodes on LCD panels are supplied with analog voltages from LCD Driver ICs (LDIs). The latest LDI developed for large LCD TV's has suffered from the degradation of analog output characteristics (target voltage: AVO and output voltage deviation: dVO). By the failure analysis, humps in $I_D-V_G$ curves have been observed in high voltage (HV) NMOS devices for input transistors in amplifiers. The hump is investigated to be the main cause of the deviation for the driving current in HV NMOS transistors. It also makes the matching between two input transistors worse and consequently aggravates the analog output characteristics. By simply modifying the active layout of HV NMOS transistors, this hump was removed and the analog characteristics (AVO &dVO) were improved significantly. In the help of the improved analog characteristics, it also became possible to reduce the size of the input transistors less than a half of conventional transistors and significantly improve the integration density of LDIs.
Keywords
LDI; AVO; dVO; Hump; Amplifier input transistor; Matching; Pillar;
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