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http://dx.doi.org/10.4313/JKEM.2008.21.10.896

A Dielectric Constant Measurement Method of Unprepared Samples  

Lee, Won-Hui (포항공과대학교 미래정보기술사업단)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.21, no.10, 2008 , pp. 896-900 More about this Journal
Abstract
A measurement method of the dielectric constant of materials whose standard sample is not prepared easily is proposed. The unprepared sample of the material is placed in a cavity, and the resonant frequency is measured. A commercial software simulates the same sample and the cavity leading to find the correct dielectric constant. The measured samples include a ceramic, a forced glass, and a powdered enamel. The measured dielectric constant of a ceramic, a forced glass, and a powdered enamel are 11-j0.0033(${\epsilon}_{\gamma}=11,\;tan{\delta}=0.0003$), 4.15-j0.053(${\epsilon}_{\gamma}=4.15,\;tan{\delta}=0.0128$), and 3.9-j0.042(${\epsilon}_{\gamma}=3.9,\;tan{\delta}=0.0108$) respectively.
Keywords
Dielectric constant; Unprepared sample; Resonant frequency; Cavity;
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Times Cited By KSCI : 1  (Citation Analysis)
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